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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Imaging Fingerprints of an Ancient Egyptian Mummy by Propagation-Based Phase-Contrast X-Ray Tomography

Electron Holography on Superconducting States of QMG-YBa2Cu3O7-y

Effect of Surface Treatment of Graphite Particles on the Composite Supercapacitor of Hydrous Ruthenium Oxides Coatings by Cathodic Deposition Method

Quantification of Milling Rate and Reduction in Amorphous Damage using Low Energy, Small Spot, Argon Ion Milling for TEM Specimens prepared by FIB.

Characterization of Boron Containing Graphite Using TEM and EELS

Investigation of Exfoliated Graphene Flakes and Their Self-Assembly Capabilities to Form Thin Coating Films

Effect of Clay Loading in the Morphology and Electrical Conductivity of Polyaniline-Clay/Elastomer Semiconductors

Non-invasive Morphological and Elemental Analysis of Ivory Plate for Artworks Authentication Using ESEM and EDS

Exploring Artifact Signals in Atom Probe Mass Spectra

The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Relative contrast in a-Si and c-Si in ADF-STEM imaging

Solving microcharacterisation problems in industry through the use of mapping

Data Analysis Methods for Modern Analytical Electron Microscopy

Structure Determination of a Magnetic Semiconductor: MnGeN2

Cerium Reduction at the Interface between Ceria and Yttria-stabilised Zirconia and Implications for Interfacial Oxygen Non-stoichiometry

The Coherent X-ray Sub-micro and Nanoprobe Stations for the CARNAUBA Beamline at the Sirius-LNLS Storage Ring.

Direct imaging of skyrmion in plan-view of a polycrystalline FeGe thin film

Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMA

MIPAR™: 2D and 3D Microstructural Characterization Software Designed for Materials Scientists, by Materials Scientists

Expression of Cyclic AMP-Receptor (cARP) Proteins by Fibroblasts in Culture: Effects of Mechanical Disruption

Microscopy and Microanalysis

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