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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Direct imaging of skyrmion in plan-view of a polycrystalline FeGe thin film

The Southwestern Center for Aberration Corrected Electron Microscopy at Arizona State University: The Facility

Non-invasive Morphological and Elemental Analysis of Ivory Plate for Artworks Authentication Using ESEM and EDS

Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder

Analysis of Contamination in Nanoscaled Film Structures with TEM & XPS

Optimized Live Volumetric Imaging with Light Sheet Microscopy and Related Strategies

Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMA

Contributions of Elastically and Inelastically Scattered Electrons to High-Resolution Off-Axis Electron Holograms – a Quantitative Analysis

Advances and Challenges in Electron Tomography

Observation of Magnetic Circular Dichroism in the Electron Microscope

Indium-Tin-Oxide (ITO) as Stable and Effective Coating Material for Correlative Confocal and Immuno-Scanning Electron Microscopy Studies

Application of Zernike Phase-Contrast Electron Microscopy and Electron Tomography for Frozen Hydrated Complex Biological Specimens

In-Situ Measurements of Single Walled Carbon Nanotube Growth Reveal the Structures of Active and Inactive Catalyst Nanoparticles

High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2

Plasma Cleaning with Alternate Gases

Controlled Environments from Sample Preparation to Electron Microscopy Characterization

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis

Correlating Irradiation-Induced Solute Clustering with Changes of Hardness in Low and High Flux Reactor Pressure Vessel Steels

Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM

Characterization of Titanium Dioxide Pigment Particles by High-Resolution and Analytical Transmission Electron Microscopy (HRTEM and AEM)

Microscopy and Microanalysis

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