The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Jingyue Liu

doi:10.1017/S1431927603440580

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The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Published online by Cambridge University Press: 06 August 2003

Jingyue Liu

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Jingyue Liu*: Affiliation:
Science & Technology, Monsanto Company, 800 N. Lindbergh Blvd., St. Louis, MO 63167, USA

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 144 - 145

DOI: https://doi.org/10.1017/S1431927603440580 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Volume 9, Issue S02
Jingyue Liu ^(a1)
DOI: https://doi.org/10.1017/S1431927603440580

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The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

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