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Relative contrast in a-Si and c-Si in ADF-STEM imaging

Published online by Cambridge University Press:  24 July 2003

Z. Yu ,
D. A. Muller  and
J. Silcox
Z. Yu
Affiliation:
Physics Department, Cornell University, Ithaca, NY 14853
D. A. Muller
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
J. Silcox
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 848 - 849
Copyright
Copyright © Microscopy Society of America 2003