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Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Published online by Cambridge University Press:  01 August 2018

M.J. Campin ,
C.S. Bonifacio  and
P.E. Fischione
M.J. Campin
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
C.S. Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
P.E. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 862 - 863
Copyright
© Microscopy Society of America 2018 

References

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