Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method

Moving atomic-resolution imaging into the age of deep data

High-accuracy electron tomography of semiconductor devices

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Progress in Crystallographic Image Processing for Scanning Probe Microscopy

Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads

Characterization of Nanocarrier Complexes with Plasmid DNA using SEM, TEM and AFM

Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy

Comparison of Magnetic Domain Observation by Means of Magnetic Force Mi-croscopy and Lorentz Transmission Electron Microscopy

Use of the Unroofing Technique for AFM Direct Imaging of the Intra-Cellular Structure at High Resolution

Lateral Force Microscopy using Nanomanipulation

Correlated Atomic Force Microscopy and Single Molecule Localization Microscopy

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Pushing the Limits on SEM Quantification - Combined Quantification with SDD and Fully Focussing WD detectors

Factors Affecting WDS Performance Superiority over EDS

Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis

Quantitative Analysis of Heterogenous Samples by SEM/EDS

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM

Characterization and Comparison of Detector Systems for Large Area X-ray Imaging

Accurate EPMA Quantification of the First Series Transition Metals using Ll Lines

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

A Method of Component Extraction of EDS and EELS maps

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract