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Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy

Published online by Cambridge University Press:  23 September 2015

Aric W. Sanders ,
Jaevyn K. Faulk ,
Devin T. Edwards  and
Thomas T. Perkins
Aric W. Sanders
Affiliation:
National Institute of Standards and Technology, Boulder, Colorado, USA.
Jaevyn K. Faulk
Affiliation:
JILA, National Institute of Standards and Technology and University of Colorado, Boulder, Colorado 80309, United States
Devin T. Edwards
Affiliation:
JILA, National Institute of Standards and Technology and University of Colorado, Boulder, Colorado 80309, United States
Thomas T. Perkins
Affiliation:
JILA, National Institute of Standards and Technology and University of Colorado, Boulder, Colorado 80309, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1617 - 1618
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Churnside, A. B. & Perkins, T. T. FEBS Letters 588 (2014) . p 3621–3630.Google Scholar
[2] Bull, M. S., et al. ACS Nano 8 (2014) . p 4984–4995.Google Scholar
[3] Rico, , et al., Science 342 (2013) . p 741–743.CrossRefGoogle Scholar
[4] Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar
[5] Churnside, A. B., et al., Nano Letters 12 (2012) . p 3557–3561.Google Scholar