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Characterization and Comparison of Detector Systems for Large Area X-ray Imaging

Published online by Cambridge University Press:  23 September 2015

Jeffrey M. Davis ,
Julia Schmidt ,
Martin Huth ,
Sebastian Ihle ,
Daniel Steigenhofer ,
Peter Holl ,
Gerhard Lutz ,
Udo Weber ,
Adrian Niculae  and
Heike Soltau
...Show all authors
Jeffrey M. Davis
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Julia Schmidt
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Sebastian Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Daniel Steigenhofer
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Peter Holl
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Gerhard Lutz
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Udo Weber
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Adrian Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Lothar Struder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1637 - 1638
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Longoni, A., Fiorini, C., Guazzoni, C., et al, A novel high-resolution XRF spectrometer for elemental mapping based on a monolithic array of silicon drift detectors and on a polycapillary x-ray lens. X-ray Spectrometry 34 (2005) . p. 439–445.CrossRefGoogle Scholar
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