A Method of Component Extraction of EDS and EELS maps

Shixin Wang

doi:10.1017/S1431927615008995

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A Method of Component Extraction of EDS and EELS maps

Published online by Cambridge University Press: 23 September 2015

Shixin Wang

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Shixin Wang*: Affiliation:
Micron Technology, Inc., 8000 S. Federal Way, Boise, ID 83707, USA

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Information: Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1643 - 1644

DOI: https://doi.org/10.1017/S1431927615008995 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2015

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A Method of Component Extraction of EDS and EELS maps

Volume 21, Supplement S3
Shixin Wang ^(a1)
DOI: https://doi.org/10.1017/S1431927615008995

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A Method of Component Extraction of EDS and EELS maps

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