Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T18:38:11.327Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements

Published online by Cambridge University Press:  23 September 2015

John J. Donovan  and
John T. Armstrong
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, 97403
John T. Armstrong
Affiliation:
Carnegie Institution for Science, Geophysical Lab, Washington, DC, NW, 20015-1305

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1445 - 1446
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Donovan, JJ, Lowers, HA & Rusk, BG (2011). Improved Electron Probe Microanalysis of Trace Elements in Quartz. American Mineralogist 96, 274–282.CrossRefGoogle Scholar
[2] Donovan, JJ & Tingle, T (1996). An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis, Jour. of Micros. Microanal, 1–7.Google Scholar
[3] Armstrong, JT (1988). Quantitative Analysis of Silicate and Oxide Materials: Comparison of Monte Carlo, ZAF, and Procedures. Microbeam Analysis, 239–246.Google Scholar