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STEM and EELS study of the Graphene/Bi2Se3 Interface

Published online by Cambridge University Press:  23 September 2015

D.M. Kepaptsoglou ,
D. Gilks ,
L. Lari ,
Q.M. Ramasse ,
P. Galindo ,
M. Weinert ,
L. Li ,
G. Nicotra  and
V.K. Lazarov
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Warrington, WA4 4AD, UK
D. Gilks
Affiliation:
Department of Physics, University of York, Heslington, York, YO10 5DD, UK,
L. Lari
Affiliation:
Department of Physics, University of York, Heslington, York, YO10 5DD, UK, York JEOL Nanocentre, University of York, Heslington, York, YO10 5BR, UK
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Warrington, WA4 4AD, UK
P. Galindo
Affiliation:
Department of Computer Science and Engineering, Universidad de Cadiz, 11510 Puerto Real, Spain
M. Weinert
Affiliation:
University of Wisconsin Milwaukee, Milwaukee, 53211,WI, USA
L. Li
Affiliation:
University of Wisconsin Milwaukee, Milwaukee, 53211,WI, USA
G. Nicotra
Affiliation:
Institute for microelectronics and microsystems, CNR Catania, 95121 Catania CT, Sicilia, Italy

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1151 - 1152
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Kou, L., et al., Nano Lett. 13 (2012), p 6251.CrossRefGoogle Scholar
[3] Liu, Y, et al., Phys. Rev. Lett. 110 (2013), p 186804.Google Scholar
[4] Liu, Y, et al., Nat Phys 10 (2014), p 294.CrossRefGoogle Scholar
[5] The authors acknowledge funding from EPSRC via research grants EP/K013114/1 and EP/K032852/1. SuperSTEM is the U.K. National Facility for Aberration-Corrected STEM funded by the EPSRC. Part of this work was performed at BeyondNano CNR-IMM, supported by MIUR under the project Beyond-Nano (PON a3_00363).Google Scholar