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Volume 16 - Supplement S2 - July 2010

Contents

Page 5 of 50

Instrumentation and Techniques Symposia

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

  • Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope

  • Y Oshima, H Sawada, E Okunishi, Y Kondo, S Niitaka, H Takagi, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 162-163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • A Simple Autofocus Technique for Aberration Corrected TEM

  • G Möbus
  • Published online by Cambridge University Press:
    01 August 2010, pp. 164-165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB Science and Applications in Materials and Biology

Abstract

  • Latest Developments in FIB Technology and Applications

  • L Giannuzzi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 166-167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Multiple Double XTEM Sample Preparation of Sub-10 nm Diameter Si Nanowires

  • L Gignac, S Mittal, S Bansaruntip, G Cohen, J Sleight
  • Published online by Cambridge University Press:
    01 August 2010, pp. 168-169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method

  • H-J Kang, JH Kim, JW Oh, TS Back, HJ Kim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 170-171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative Assessment of TEM-Sample Warping Caused by FIB Preparation

  • R Salzer, A Graff, M Simon, F Altmann
  • Published online by Cambridge University Press:
    01 August 2010, pp. 172-173
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Application of Focus Ion Beam Technique for TEM Multilayer Materials Examination

  • J Wojewoda-Budka, P Zieba, J Morgiel, N Sobczak, R Nowak
  • Published online by Cambridge University Press:
    01 August 2010, pp. 174-175
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Methodologies for Quantifying Milling Acuity in Focused Ion Beam Systems

  • C Rue, R Young
  • Published online by Cambridge University Press:
    01 August 2010, pp. 176-177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cryo-FIB Preparation for Cryo-TEM Tomography

  • M Marko, C Hsieh, D Vetter, NJ Salmon, C Mannella
  • Published online by Cambridge University Press:
    01 August 2010, pp. 178-179
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ion Beam Nanodissection for 3D Compositional Mapping of Mammalian Cells

  • J Fu, K Narayan, TJ Prosa, S Subramaniam
  • Published online by Cambridge University Press:
    01 August 2010, pp. 180-181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging Transient Blood Vessel Fusion Events by Correlative Volume Electron Microscopy

  • H Armer, G Mariggi, K Png, C Genoud, A Monteith, A Bushby, H Gerhardt, L Collinson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 182-183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 3D Microanalysis of Biological Specimen Using FIB SEM

  • K Scott
  • Published online by Cambridge University Press:
    01 August 2010, pp. 184-185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Integrative Cryo-Correlative Microscopy Approaches

  • A Rigort, C Mathisen, U Boehm, A Leis, B Lich, M Hayles, T Laugks, W Baumeister, J Plitzko
  • Published online by Cambridge University Press:
    01 August 2010, pp. 186-187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Three Dimensional Ultrastructural Analysis of CNS Axons Using Serial Ion-Abrasion Scanning Electron Microscopy (SIA-SEM)

  • G Kidd, A Avishai, N Ohno, X Yin, N Avishai, A Heuer, B Trapp
  • Published online by Cambridge University Press:
    01 August 2010, pp. 188-189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Focused Ion Beam Fabrication of Isolated Nanopores in Membranes: Overcoming Effects of Channeling

  • DP Adams, VC Hodges, M Vasile, N Patterson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 190-191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Problems with Measuring Beam Size of a Focused Ion Beam System by Means of the Rise-Distance

  • L Roussel, J Orloff
  • Published online by Cambridge University Press:
    01 August 2010, pp. 192-193
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Direct-write Focused Ion Beam Lithography

  • A Joshi-Imre, L Ocola, J Klingfus
  • Published online by Cambridge University Press:
    01 August 2010, pp. 194-195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Focused Ion Beam Hard Mask: Insights into the Mechanism and a New Application for Photonic Structures

  • W McKenzie, M Hiscocks, F Ladouceur, P Munroe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 196-197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fabrication and Characterization of Ultra-High Aspect Ratio Features in Gold Using the Helium Ion Microscope

  • VS Smentkowski, R Potyrailo, L Scipioni, D Ferranti
  • Published online by Cambridge University Press:
    01 August 2010, pp. 198-199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging of Bio-Compatible Polymers in the Helium Ion Microscope

  • J Notte, L Farkas, L Scipioni, I Smith
  • Published online by Cambridge University Press:
    01 August 2010, pp. 200-201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 5 of 50