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Volume 16 - Supplement S2 - July 2010

Contents

Page 2 of 50

Instrumentation and Techniques Symposia

Vendor Symposium: Creating the Tools for Science

Abstract

  • Chemical State Mapping and Depth Profiling in a Scanning Auger Microprobe

  • C Nielsen, K Tsutsumi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 44-45
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Performance of Corrected Transmission Electron Microscopes in Combination with an In-Column Filter and a Distortion-Free Monochromator

  • S Pokrant, A Merkle, DC Bell
  • Published online by Cambridge University Press:
    01 August 2010, pp. 46-47
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Remote Plasma Cleaning from a TEM Sample Holder with an Evactron® De-Contaminator

  • CG Morgan, D Varley, R Vane
  • Published online by Cambridge University Press:
    01 August 2010, pp. 48-49
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Morphological Characterization of Bacteria Using the Atmospheric Scanning Electron Microscope (ASEM)

  • K Teramoto, H Nishiyama, Y Maruyama, Y Konyuuba, Y Abe, D Guarrera, M Suga, C Sato
  • Published online by Cambridge University Press:
    01 August 2010, pp. 50-51
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Gigantic Montages with a Fully Automated FE-SEM (Serial Sections of a Mouse Brain Tissue)

  • K Ogura, M Yamada, O Hirahara, M Mita, N Erdman, C Nielsen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 52-53
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Extremely Low Magnification EBSD with an FE-SEM

  • Y Yamamoto, K Ogura, K Kawauchi, M Shibata, N Erdman, C Nielsen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 54-55
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Order Aberration Correction in a Post-Column Energy Filter

  • N Menon, M Barfels, RD Twesten
  • Published online by Cambridge University Press:
    01 August 2010, pp. 56-57
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Gas Assisted E-beam Lithography Using the JSM-7600F Ultra-High Resolution Schottky FEG-SEM and OmniGIS

  • N Erdman, A Laudate, C Hartfield
  • Published online by Cambridge University Press:
    01 August 2010, pp. 58-59
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 3D Atom Probe for Nano-scale Chemical Analysis

  • A Davis, F Horreard, I Martin, R Benbalagh, L Renaud
  • Published online by Cambridge University Press:
    01 August 2010, pp. 60-61
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Progress in Dynamic EBSD Pattern Simulation

  • G Nolze, A Winkelmann
  • Published online by Cambridge University Press:
    01 August 2010, pp. 62-63
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 300kV Performance of a 10k x 10k Scintillator- and Fiber-Coupled CCD Camera for Transmission Electron Microscopes

  • B Lee, B Mollon, P Mooney
  • Published online by Cambridge University Press:
    01 August 2010, pp. 64-65
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

  • Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

  • M Watanabe, E Okunishi, T Aoki
  • Published online by Cambridge University Press:
    01 August 2010, pp. 66-67
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Applications of spherical aberration correction in STEM and TEM

  • S Lazar, J Etheridge, C Dwyer, B Freitag, GA Botton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 68-69
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

  • OL Krivanek, N Dellby, MF Murfitt, ZS Szilagyi, MF Chisholm, K Suenaga
  • Published online by Cambridge University Press:
    01 August 2010, pp. 70-71
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An in-situ EELS study of Co-based Fischer-Tropsch Catalysts

  • Y Zhao, TE Feltes, JR Regalbuto, RJ Meyer, RF Klie
  • Published online by Cambridge University Press:
    01 August 2010, pp. 72-73
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures

  • V Nicolosi, Z Aslam, J Kim, OL Krivanek, MF Chisholm, TJ Pennycook, AI Kirkland, N Grobert, PD Nellist
  • Published online by Cambridge University Press:
    01 August 2010, pp. 76-77
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An Investigation of Structure and Electrochemical Cycle Stability of Li[Li0.2Ni0.2Mn0.6]O2 by using Aberration Corrected Z-contrast Imaging and EELS

  • M Chi, C Fell, S Meng
  • Published online by Cambridge University Press:
    01 August 2010, pp. 78-79
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

  • SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, S Azuma, Y Ikuhara
  • Published online by Cambridge University Press:
    01 August 2010, pp. 80-81
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 2 of 50