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TEM Characterization of GaSb Growth on GaAs (001) Substrate: Growth Mode and Defect Evaluation

Published online by Cambridge University Press:  01 August 2010

S Huang ,
G Balakrishnan  and
D Huffaker
S Huang
Affiliation:
University of New Mexico
G Balakrishnan
Affiliation:
University of New Mexico
D Huffaker
Affiliation:
University of California, Los Angeles

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1516 - 1517
Copyright
Copyright © Microscopy Society of America 2010