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Influence of Microstructure on the Optical Quality of Silicon Carbide Films: A TEM Study

Published online by Cambridge University Press:  01 August 2010

S Rajasekhara ,
B Neuner III ,
G Shvets ,
PJ Ferreira  and
D Kovar
S Rajasekhara
Affiliation:
The University of Texas, Austin
B Neuner III
Affiliation:
The University of Texas, Austin
G Shvets
Affiliation:
The University of Texas, Austin
PJ Ferreira
Affiliation:
The University of Texas, Austin
D Kovar
Affiliation:
The University of Texas, Austin

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1450 - 1451
Copyright
Copyright © Microscopy Society of America 2010