Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education

Electron Microscopy Informed Catalyst Design

TMBA: DBW @70, STEM EELS SI @30, PANS TBD

The Role of Simulation of Valence Electron Energy Loss Spectroscopy (EELS) for Understanding Electronic Structure and Optical Properties of Materials

The Major Developments in Camera and Electron Energy Loss Spectrometer Technology Since the Turn of the Century

A STEM-based Path Towards Atomic-scale Silicon-based Devices

Toward More Brilliant Quantitative X-ray Analysis in (S)TEM

An Electron Microscopy Collaboratory for Correlative Imaging Sciences

An Interactive and Adaptive Online Electron Microscopy Education Platform

Evolution of Microstructures and Interfaces in Compositionally Graded Mixed Oxide Thin Films for Nanoelectronics and Energy

A TD-DFT Treatment of Electronic Excitations in the STEM Spanning Dipole and Impact Scattering Regimes

In situ Cathodoluminescence and Monitoring Electronic Structure Change Using Optical TEM Holder

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials

Electron Probe Microanalysis of Actinide Elements: Our Past, Present, and Future

Beyond Rules-of-Thumb: Optimizing EPMA Measurements

Quantitative Compositional Stage Mapping and Cluster Analysis Applied to a Vanadian Slag Sample

Standard Reference Materials of Microanalysis in China

Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?

Average Atomic Number and Electron Backscattering in Compounds

SD-WDS: Bremsstrahlung Determination by Theoretical Calculation and Subsequent Estimation of Mass Attenuation Coefficients

An Improved EPMA Method for Gaining High Precision and High Accuracy Determination of Trace Elements in Quartz

Recent Advances in the Analysis of Nitrogen by EPMA

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials