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Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?

Published online by Cambridge University Press:  05 August 2019

Julien M. Allaz ,
Razvan-Gabriel Popa ,
Eric Reusser  and
Lukas Martin
Julien M. Allaz*
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Razvan-Gabriel Popa
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Eric Reusser
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Lukas Martin
Affiliation:
NAGRA, Wettingen, Switzerland.
*
*Corresponding author: [email protected]

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2312 - 2313
Copyright
Copyright © Microscopy Society of America 2019 

References

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