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An Electron Microscopy Collaboratory for Correlative Imaging Sciences

Published online by Cambridge University Press:  05 August 2019

Daniel E. Huber ,
Frank J. Scheltens ,
Robert E.A. Williams ,
David B. Williams  and
David W. McComb
Daniel E. Huber
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
Frank J. Scheltens
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
Robert E.A. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA.
David B. Williams
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA. Dept. Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.
David W. McComb*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA. Dept. Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2294 - 2295
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]Isabell, TC et al. , Microscopy & Microanalysis 14 (2008), p. 872.Google Scholar
[8]Huber, DA et al. , Microscopy Today (2018), p. 28.Google Scholar
[9]The authors acknowledge support from ThermoFisherScientific, the Air Force Research Laboratory (AFRL) and NSF (Award Number: 0812348 “Remote Microscopy Station to Provide Direct Access to Image and Probe-Corrected Transmission Electron Microscopes for Transformative Atomically-Resolved Analysis of Structural and Functional Materials for Future Materials Innovation and Manufacturing”) to create the remote operation system at North Carolina Agricultural and Technical UniversityGoogle Scholar