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Evolution of Microstructures and Interfaces in Compositionally Graded Mixed Oxide Thin Films for Nanoelectronics and Energy

Published online by Cambridge University Press:  05 August 2019

Avnish Singh Pal ,
Ankit Singh ,
RK Mandal  and
Joysurya Basu
Avnish Singh Pal
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology (BHU), Varanasi, Varanasi, UP, India.
Ankit Singh
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology (BHU), Varanasi, Varanasi, UP, India.
RK Mandal
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology (BHU), Varanasi, Varanasi, UP, India.
Joysurya Basu*
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology (BHU), Varanasi, Varanasi, UP, India.
*
*Corresponding author: [email protected]

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2298 - 2299
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chen, Z et al. , MRS Bull. 36 (2011), p. 498.Google Scholar
[2]Cho, Y et al. , J. Cho, Adv. Energy Mater. 1 (2011), p. 821.Google Scholar
[3]Zhou, W et al. , Sci. Reports 1 (2011), p. 155.Google Scholar
[4]Guiton, BS and Davies, PK, Nature Mater. 6 (2007), p. 586.Google Scholar
[5]Ni, Y and Khachaturyan, AG, Nature Mater. 8 (2009), p. 410.Google Scholar