Microscopy and Microanalysis: Volume 9 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract

HRTEM and EELS Analysis of Interfacial Reactions in Ti/Si1-xGex/Si(100)

Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands

Development of a STEM-EBIC/CL System

Developments in Magnetic Recording Media Technology and the Role of TEM-based Microanalysis

Magnetic Imaging of Nanocomposite Magnets

In-situ Lorentz TEM Observation of Magnetization Process in Fe-Pd Alloy

Characterization of Nanostructured Magnetic Recording Media

In-situ TEM Study of Thermal Stabilities of Metastable Silicon Phases

STEM Scanning Mode Observation of Semiconductor Devices

Structure Determination of Fe3O4(111)/MgO(111) Polar Oxide Interface

Energy Contrast from Si Low Loss at 74 eV for Semiconductor Devices

Semiconducting Nanobelts of ZnO and ZnS

Observation of cross sectional semiconductor sample with newly developed SEI/STEM/TEM microscope

TEM and PEELS Study of Mn Diffusion in an MRAM Structure

The effect of residual lens aberrations on the determination of column positions around partial dislocations in GaAs

Meso-Structure Study of a Porous SiO2 Thin Film on (001) Si by Transmission Electron Microscopy

Electron Tomography of Microelectronic Devices

Buried Oxide Formation in Low-Dose Low-Energy SIMOX

Thermal Stability of Hf-based High-κ Dielectric Films on Si(100)

TEM Study Of Silicide Formation And Microstructural Development Of Ni/ Si1-xGex

Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract