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Volume 12 - Issue S02 - August 2006

Contents

Page 18 of 45

Microscopy in Nanoscience and Nanotechnology

Abstract

  • WETSEMTM Technology for In-Situ Studies of Dynamic Processes in SEM

  • I Ruach$ndash;Nir, O Zrihan, A Sabban, Y Tzabari
  • Published online by Cambridge University Press:
    31 July 2006, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Macroscopic Phase Separation Kinetics of TPPS4 J-aggregate Solutions Analyzed with Confocal Microscopy

  • RJ Johnston, N Hedin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Effect of Heating on the Surface Charge of Copper Oxide Nanorods

  • S Gangopadhyay, R Shende, S Hasan, LM Ross Jr.
  • Published online by Cambridge University Press:
    31 July 2006, pp. 686-687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Morphology, Electronic and Optical Properties of Si Nanowires

  • P-S G Kim, GA Botton, TK Sham
  • Published online by Cambridge University Press:
    31 July 2006, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Synthesis and Structural Characterization of Sulfur Nanowires

  • P Santiago, E Carvajal, D Mendoza, L Rendon
  • Published online by Cambridge University Press:
    31 July 2006, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • TEM Study of the Morphology and Assembly of Water-Soluble Molecular Rods

  • C Gothard, W-A Chiou, JS Nowick
  • Published online by Cambridge University Press:
    31 July 2006, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Interfaces of ZnO Nanowires Grown on Semiconducting Surfaces

  • J Basu, R Divarkar, J Deneen, X Wang, HO Jacobs, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Nanowire Formation Using Templates of Self-Assembled Nanofold Networks on Surfaces of Layered Crystals

  • F Dietz, E Spiecker, H Schroeder, U Dahmen, W Jäger
  • Published online by Cambridge University Press:
    31 July 2006, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Growth of ZnO Nanorods: A TEM Study

  • R Divakar, J Basu, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Formation of Iron Oxide Nanorods Using Electron Beam-Induced Deposition

  • M Shimojo, M Takeguchi, W Lu, K Furuya
  • Published online by Cambridge University Press:
    31 July 2006, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Lift-out and In-situ STM-TEM Studies of Individual GaN Nanowires

  • ML Taheri, B Simpkins, P Pehrsson, RM Stroud
  • Published online by Cambridge University Press:
    31 July 2006, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • In-situ TEM Synthesis of WO2.9 Nanofibers: Characteristics and Growth Mechanism

  • JF Al-Sharab, RK Sadangi, V Shukla, BH Kear
  • Published online by Cambridge University Press:
    31 July 2006, pp. 704-705
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • In-situ TEM-STM Investigation of Conductance in Cu Atomic Wires

  • JL Rullan, KA Dunn
  • Published online by Cambridge University Press:
    31 July 2006, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Characterization of As-Deposited Crystalline NiTi Thin Films

  • D Bronfenbrenner, V Radmilovic, S McHugo, R Gronsky
  • Published online by Cambridge University Press:
    31 July 2006, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • TEM Analysis of Tunnel-Junction Structures in FeCo Films on GaAs Grown by Molecular Beam Epitaxy

  • S McKernan, CS Kong, X Dong, CJ Palmstrøm
  • Published online by Cambridge University Press:
    31 July 2006, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods

  • HA Calderón, MA Vidal, H Ladrón de Guevara
  • Published online by Cambridge University Press:
    31 July 2006, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Simulation of Annular Dark Field Images of InAs/InP Quantum Dots

  • MD Robertson, JC Bennett, MJ Burns, D Currie
  • Published online by Cambridge University Press:
    31 July 2006, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Nano-analysis of the Metallic Multilayers Using High Resolution Microscopy

  • A Genç, R Banerjee, J Ringnalda, DM Maher, HL Fraser
  • Published online by Cambridge University Press:
    31 July 2006, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Analytical XTEM Study of Ir/InAlAs Interfacial Reaction for InP-based High Electron Mobility Transistors (HEMTs) Gate Technology

  • L Wang, W Zhao, I Adesida
  • Published online by Cambridge University Press:
    31 July 2006, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Self-hardening of Nanocrystalline Ti-B-N Thin Films

  • JG Wen, PH Mayrhofer, C Mitterer, JE Greene, I Petrov
  • Published online by Cambridge University Press:
    31 July 2006, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 18 of 45