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Volume 12 - Issue S02 - August 2006

Contents

Page 15 of 45

Microscopy in Nanoscience and Nanotechnology

Abstract

  • Patterning and Identity of Functional Oxide Nanostructures

  • Z Pan, V Dravid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 562-563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nanocavity Networks by Folding Sheets of Layered Crystals

  • E Spiecker, AK Schmid, AM Minor, U Dahmen, S Hollensteiner, W Jäger
  • Published online by Cambridge University Press:
    31 July 2006, pp. 564-565
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Extended BaZrO3 Nanodot Columns in Thick YB2Cu3O7 Film

  • J Li, S Kang, A Goyal
  • Published online by Cambridge University Press:
    31 July 2006, pp. 566-567
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Morphology and Phase Ordering in Polymer-Derived Nanoceramics

  • S Taylor, J Wan, P Malenfant, A Alizadeh, M Manoharan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 568-569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Structural Characterization of Carbon Nanotubes

  • P Lambin, JF Colomer, L Henrard, A Lucas, V Meunier
  • Published online by Cambridge University Press:
    31 July 2006, pp. 570-571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • X-ray Microscopy Techniques for Nanostructure Analysis

  • J Kirz
  • Published online by Cambridge University Press:
    31 July 2006, pp. 572-573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Diffraction Microscopy – Towards an Ultra-High-Resolution Microscope

  • T Beetz, Y Zhu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 574-575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Atomic Resolution Electron Diffraction Imaging of Metallic Nanoclusters

  • W Huang, B Jiang, J-M Zuo
  • Published online by Cambridge University Press:
    31 July 2006, pp. 576-577
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Assignment of Chiral Indices of Boron Nitride Nanotubes by Electron Diffraction

  • R Arenal, M Kociak, A Loiseau, DJ Miller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 578-579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Imaging Electronic Phase Separation in La1-xCaxMnO3 Using Electron Nano-Diffraction

  • J Tao, W Luo, D Niebieskikwiat, M Varela, M Salamon, S Pantelides, J-M Zuo, S Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 580-581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Structure of Multiwall Nanotubes-Different Models and Electron Diffraction Results

  • J-M Zuo, A Celik-Aktas, M Gao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 582-583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Using STEM Image as a Map for Parallel Beam Electron Diffraction from a Nano-Particle on a TEM-STEM System

  • H He, JC H Spence
  • Published online by Cambridge University Press:
    31 July 2006, pp. 584-585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Radiation Damage of C60 Single Molecules Encapsulated in Carbon Nanotube

  • M Koshino, K Suenaga, E Nakamura
  • Published online by Cambridge University Press:
    31 July 2006, pp. 586-587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Fluctuation Electron Microscopy of Shungite, a Disordered Natural Carbonaceous Material

  • M Treacy, A Rougee, P Buseck
  • Published online by Cambridge University Press:
    31 July 2006, pp. 588-589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Transmission Electron Microscopy of Polymer-Graphene Nanocomposites

  • KM Kohlhaas, EA Stach, S Stankovich, RS Ruoff
  • Published online by Cambridge University Press:
    31 July 2006, pp. 590-591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • EELS and EFTEM Imaging of Surface Plasmons in Silica-Ag Core-Shell Nanoparticles

  • AS Eggeman, AK Petford-Long, PJ Dobson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 592-593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Characterization of Defects in Nanoparticles

  • J Deneen, CB Carter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 594-595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Coherence Effects in Electron Diffraction from Presolar Graphenes

  • E Mandell, P Fraundorf
  • Published online by Cambridge University Press:
    31 July 2006, pp. 596-597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Synthesis and Characterization of L-Arginine H3PO4 Nano-Crystals with Non-Linear Optical Properties.

  • J Hernández Paredes, H Esparza Ponce, A Duarte Moller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 598-599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Cold Sample Preparation for Cross-sectional Transmission Electron Microscopy: Cu Nanocrystals Embedded in 2 μm SiO2 films

  • B Johannessen, DJ Llewellyn, P Kluth, MC Ridgway
  • Published online by Cambridge University Press:
    31 July 2006, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 15 of 45