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Characterization of Sputtered Ge-Sn Thin Films by High Resolution Methods

Published online by Cambridge University Press:  31 July 2006

HA Calderón ,
MA Vidal  and
H Ladrón de Guevara
HA Calderón
Affiliation:
Instituto Politécnico Nacional,Mexico.
MA Vidal
Affiliation:
Universidad Autónoma de San Luis Potosí,Mexico.
H Ladrón de Guevara
Affiliation:
Universidad Autónoma de San Luis Potosí,Mexico.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 712 - 713
Copyright
© 2006 Microscopy Society of America