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In-situ TEM-STM Investigation of Conductance in Cu Atomic Wires

Published online by Cambridge University Press:  31 July 2006

JL Rullan  and
KA Dunn
JL Rullan
Affiliation:
University at Albany
KA Dunn
Affiliation:
University at Albany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 706 - 707
Copyright
© 2006 Microscopy Society of America