Microscopy and Microanalysis: Volume 27 - Issue S1

Only show content I have access to (1140)

Over 3 years (1141)

Physical Sciences Symposia (574)

Biological Sciences Symposia (212)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 27 - Supplement S1 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

An Ultrafast Direct Electron Camera for 4D STEM

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging

Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

Is the Helium Ion Microscope (Ne) suitable for EBSD sample preparation?

Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics

In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB

The virtual FIB: Simulating 3D in situ lift-out for visualization and technique development

Microscopy and Microanalysis for Real World Problem Solving

Use of Full-Field X- ray Imaging and Ptychographic X-ray Computed Tomography for the Investigation of 3D Morphology of Micro-Nano Silver Materials for Advanced Electronics Packaging Applications

Micro Computed Tomography Analysis of Four-Way Conversion Catalysts using Artificial Intelligence-Enabled Image Processing

Multi-Energy X-Ray Computed Tomography for Source Rock Characterization

Metal Foams: Linking Dynamic CT Results to Simulation and Modeling

Dynamic X-ray micro-CT insights of the recovery of ore bodies in presence of clay

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Developing near-atomic-scale chemical analysis in liquid-phase S/TEM to study high capacity battery anodes

Beam-induced heating at low electron fluxes during liquid phase transmission electron microscopy

In-situ Liquid Electrochemical TEM Investigation of Semi Solid-State LMNO Micro-Battery

The effect of interfaces in liquid phase electron microscopy from an empirical viewpoint

Advances in Analytical STEM-in-SEM

STEM-in-SEM: A Re-Emerging Material Measurement Approach

Combining in situ heating with transmission diffraction and imaging in SEM for investigation of early stages of solid-state dewetting

Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 27 - Supplement S1 - August 2021

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Microscopy and Microanalysis for Real World Problem Solving

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Advances in Analytical STEM-in-SEM