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The effect of interfaces in liquid phase electron microscopy from an empirical viewpoint

Published online by Cambridge University Press:  30 July 2021

Patricia Abellan
Affiliation:
IMN / University of Nantes, Nantes, France
Jay LaVerne
Affiliation:
Radiation Lab. and Dep. of Phys. / University of Notre Dame, Notre Dame, Indiana, United States

Abstract

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Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

de Jonge, and Peckys, , ACS Nano 10 (2016) 9061-9063; T. H. Moser et al. Micron 117 (2019), 8-15CrossRefGoogle Scholar
LaVerne, J.A., 2004. Radiation Chemical Effects of Heavy Ions, in: Mozumder, A., Hatano, Y. (Eds.), Charged Particle and Photon Interactions with Matter. Marcel Dekker, Inc, New York, pp. 403-429.Google Scholar
Schneider, N. M. et al. , The Journal of Phys. Chem. C (2014) 118, 22373-22382; J.H. Park et al., Nano letters 15 (2015), 5314-5320; Gupta et al., Nanoscale (2018) 10, 7702-7710CrossRefGoogle Scholar
Woehl, & Abellan, , Journal of Microsc. (2017) 265 , 135-147; Sutter et al., Nat. Comm. (2014) 5, 1-9CrossRefGoogle Scholar
Abellan, P., LaVerne, J. et al. In preparationGoogle Scholar