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Is the Helium Ion Microscope (Ne) suitable for EBSD sample preparation?
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Mayer, J.; Giannuzzi, L.; Kamino, T.; Michael, J. MRS Bulletin, 2007, 32(5), 400-407CrossRefGoogle Scholar
Traylor, R.; Zhang, R.; Kacher, J.; Douglas, J.O.; Bagot, P.A.J.; Minor, A.M. Acta Materialia, 2020, 184, 199-210,CrossRefGoogle Scholar
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