Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-29T19:21:52.499Z Has data issue: false hasContentIssue false
  • English
  • Français

Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

Published online by Cambridge University Press:  30 July 2021

Gudrun Wilhelm ,
Ute Golla-Schindler ,
Katharina Wöhrl ,
Christian Geisbauer ,
Graham Cooke ,
Timo Bernthaler  and
Gerhard Schneider
Gudrun Wilhelm
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Baden-Wurttemberg, Germany
Ute Golla-Schindler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Germany
Katharina Wöhrl
Affiliation:
Abteilung ZAF/CARISSMA, Technische Hochschule Ingolstadt, Ingolstadt, Germany, Ingolstadt, Bayern, Germany
Christian Geisbauer
Affiliation:
Abteilung ZAF/Carissima, Technische Hochschule Ingolstadt, Ingolstadt, Germany, Aalen, Bayern, Germany
Graham Cooke
Affiliation:
Hiden Analytical GmbH, Düsseldorf, Germany, Germany
Timo Bernthaler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Gerhard Schneider
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1012 - 1015
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Alliata, D, Kötz, R, Novak, P, Siegenthaler, H 2000 Electrochemistry Communications 2 436–440.CrossRefGoogle Scholar
Vetter, J, Novák, P, Wagner M, R, Veit, C, Möller, K-C, Besenhard J, O, Winter, M, Wohlfahrt-Mehrens, M, Vogler, C, Hammouche, A 2005 Journal of Power Sources 147 269–281CrossRefGoogle Scholar
Golla-Schindler, U, Zeibig, D, Prickler, L, Behn, S, Bernthaler, T, Schneider, G 2018 Micron 113 10–19CrossRefGoogle Scholar