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Physical-chemistry of “polygomer” surfaces through AFM force measurements

Published online by Cambridge University Press:  17 November 2003

C. Devaux  and
J.-P. Chapel
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Abstract

AFM microscope is used here as a surface forces apparatus at the nanometer scale. We show through several examples that the curves forces (nN) vs. distance (nm) obtained are the physico-chemical signature of the interacting surfaces. From such a curve, chemical, frictional (mobility) and mechanical top surface aspects can be studied.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 5: Science et Génie des MatériauxMatériaux et microscopies , May 2003 , pp. 541 - 549
Copyright
© La Revue de Métallurgie, 2003

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