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Some Developments in the X-ray Analysis of Single-Crystals

Published online by Cambridge University Press:  24 October 2008

R. L. Aston
R. L. Aston
Affiliation:
Barker Graduate Scholar of the University of Sydney, Dominion Exhibitioner of Trinity College
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Extract

A method has been devised by Dr Alex Müller for determining the orientation of a single-crystal of metal by photographic measurement of the reflection of characteristic X-rays from surface layers. The incident beam passes perpendicularly through an axis of rotation around which the crystal is turned until a reflection is obtained with one of the component wave-lengths of the X-rays.

Type
Research Article
Information
Mathematical Proceedings of the Cambridge Philosophical Society , Volume 23 , Issue 5 , January 1927 , pp. 561 - 577
Copyright
Copyright © Cambridge Philosophical Society 1927

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References

* Roy. Soc. Proc. A, 105 (1924), p. 500.CrossRefGoogle Scholar

* Scherrer, , Phys. Zeitschr. 19 (1918), p. 23.Google Scholar

† Westgren, , “Engineering,” 111 (1921), p. 727.Google Scholar