Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-29T06:18:19.192Z Has data issue: false hasContentIssue false

X-ray optics for X-ray laser research applications

Published online by Cambridge University Press:  09 March 2009

N. M. Ceglio
Affiliation:
Laser Fusion Program, Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, CA, 94550 USA

Abstract

State of the art capabilities in soft X-ray lenses, multilayer mirrors, beamsplitters, and synthetically generated holograms are reviewed. Application of these capabilities in recent X-ray laser cavity experiments, and to the development of a soft X-ray interferometer and a high intensity (≥1013 watt/cm2) soft X-ray laser are discussed.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Attwood, D. T. et al. 1978 Phys. Rev. Lett. 40, 184.CrossRefGoogle Scholar
Attwood, D. T. et al. 1988 OSA Proceeding on Short Wavelength Coherent Radiation: Generation and Applications 2, 274. (Cape Cod, MA).CrossRefGoogle Scholar
Bean, K. 1978 IEEE Trans. Elect. Devices ED-25, 1185.CrossRefGoogle Scholar
Bogli, V. et al. 1987 In X-Ray Microscopy II, Sayre, D. et al. , eds. (Springer-Verlag, New York) 80.Google Scholar
Bromley, E. I. et al. 1983 J. Vac. Sci. Tech. B1, 1346.Google Scholar
Brown, B. R. & Luhmann, A. W. 1966 Appl. Opt. 5, 967.CrossRefGoogle Scholar
Ceglio, N. M. 1981 Impact of Microfabrication Technology on X-Ray Optics in Low Energy X-Ray Diagnostics, Attwood, D. T. and Henke, B. L. eds. (AIP, New York) 210.Google Scholar
Ceglio, N. M., ed. 1985 Proceedings of the First Symposium on the Applications of Laboratory X-Ray Lasers, Lawrence Livermore National Laboratory Report #CONF-850293.Google Scholar
Ceglio, N. M. 1989 “Revolution in X-Ray Optics,” to be published in Journal of X-ray Science and Technology.CrossRefGoogle Scholar
Ceglio, N. M. 1987 Advances in X-Ray Optics –'87, in X-ray Microscopy II, Sayre, D. et al. , eds. (Springer Verlag, New York) 130.Google Scholar
Ceglio, N. M. & Dhez, P. eds. 1986 SPIE Proceedings 668.Google Scholar
Ceglio, N. M. & Smith, H. I. 1980 Proceedings VIII Int'l Conf. on X-ray Optics and Microanalysis, Beaman, D. R.Ogilvie, R. E. & Wittry, D. B., eds. (Pendell Publishing, Midland, MI) 255.Google Scholar
Ceglio, N. M. et al. 1986 J. de Physique (Paris) C6, 277.Google Scholar
Ceglio, N. M. et al. 1986a SPIE Proceedings 688, 44.CrossRefGoogle Scholar
Ceglio, N. M. et al. 1988 Applied Optics 27, 5022.CrossRefGoogle Scholar
Ceglio, N. M. et al. 1988a Opt. Lett. 13, 108.CrossRefGoogle Scholar
Ceglio, N. M. et al. 1988b Opt. Lett. 13, 267.CrossRefGoogle Scholar
Ceglio, N. M. et al. 1989 Optics Communications 69, 285.CrossRefGoogle Scholar
Hawryluk, A. M. et al. 1986 SPIE Proceedings 688, 81.CrossRefGoogle Scholar
Hawryluk, A. M. et al. 1988 “Applications of Microfabrication Technology to X-Ray Laser Cavities,” to be published in Journal of Vacuum Science Technology.CrossRefGoogle Scholar
Kirz, J. 1974 JOSA 64, 301.CrossRefGoogle Scholar
Kuhne, M. (PTB Institute, Berlin) 1987 private communication, The use of the Hook Method for diagnosis of X-ray laser media.Google Scholar
Kuhne, M. et al. 1986 SPIE Proceedings 688, 76.CrossRefGoogle Scholar
Landenburg, B. et al. eds. 1954 Physical Measurements in Gas Dynamics and Combustion (Princeton University Press, Princeton, NJ).Google Scholar
Marlowe, W. C. 1967 Appl. Opt. 6, 1715.CrossRefGoogle Scholar
Marshall, G. 1985 SPIE Proceedings 563.Google Scholar
Matthews, D. L. et al. 1985 Phys. Rev. Lett. 54, 110.CrossRefGoogle Scholar
MacGowan, B. J. et al. 1987 Phys. Rev. A 59, 2157.Google Scholar
MacGowan, B. J. et al. 1987a J. Appl. Phys. 61, 5243.CrossRefGoogle Scholar
MacGowan, B. J. et al. 1988 OSA Proceeding on Short Wavelength Coherent Radiation: Generation and Applications 2 (Cape Cod, MA).Google Scholar
More, R. M. et al. 1986 SPIE Proceedings 688, 134.CrossRefGoogle Scholar
Petford-Long, A. K. et al. 1987 J. Appl. Phys. 61, 1422.CrossRefGoogle Scholar
Rarback, H. et al. 1988 Sci. Instr. 59, 52; also Y. Vladimirsky et al. 1988 Nucl. Instr. and Meth. A266, 324.CrossRefGoogle Scholar
Siddons, D. P. 1981 Some Applications of X-Ray Interferometry, in Low Energy X-ray Diagnostics, Attwood, D. T. & Henke, B. L. eds. (AIP, New York) 236.Google Scholar
Spiller, E. & Rosenbluth, A. E. 1985 SPIE Proceedings 563, 221.CrossRefGoogle Scholar
Stearns, D. G. et al. 1986 SPIE Proceedings 688, 91.CrossRefGoogle Scholar
Stearns, D. G. et al. 1988 Private communication, Lawrence Livermore National Laboratory.Google Scholar
Suckewer, S. et al. 1985 Phys. Rev. Lett. 55, 1753.CrossRefGoogle Scholar
Young, M. 1972 JOSA 62, 972.CrossRefGoogle Scholar