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Time-resolved X-ray spectroscopy of optical-field-ionized plasmas

Published online by Cambridge University Press:  09 March 2009

S. Borgström
Affiliation:
Department of Physics, Lund Institute of Technology, S-221 00 Lund, Sweden
T. Starczewski
Affiliation:
Department of Physics, Lund Institute of Technology, S-221 00 Lund, Sweden
S. Svanberg
Affiliation:
Department of Physics, Lund Institute of Technology, S-221 00 Lund, Sweden
C.-G. Wahlström
Affiliation:
Department of Physics, Lund Institute of Technology, S-221 00 Lund, Sweden
E. Fill
Affiliation:
Max-Planck-Institut für Quantenoptik, D-85748 Garching, Germany
J. Steingruber
Affiliation:
Max-Planck-Institut für Quantenoptik, D-85748 Garching, Germany

Abstract

The time-dependent soft X-ray emission of helium and nitrogen plasmas generated by optical-field ionization is reported. The experiments were carried out by focusing pulses of the high-power Ti:sapphire laser of the Lund Institute of Technology (λ = 796 nm, pulse duration 150 fs, pulse energy 150 mJ) to a 50-μm diameter spot close to a nozzle, using He and N2 as target gases. The emission on He+, N4+, and N3+ resonance lines was recorded by means of a flat-field grating spectrometer coupled to an X-ray streak camera. A pronounced difference in the temporal shape of the emission of the Lyman-α line of hydrogen-like helium and of the 2p−3d resonance lines of lithium-like and beryllium-like nitrogen was observed. The helium line exhibited an initial spike followed by a slow revival of the emission, whereas the nitrogen lines showed a slow decay after a fast initial rise. These observations are explained with the help of simulations.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1995

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References

REFERENCES

Altucci, C. et al. 1995, to be published.Google Scholar
Amendt, P. et al. 1991 Phys. Rev. Lett. 66, 2589.CrossRefGoogle Scholar
Augst, S. et al. 1989 Phys. Rev. Lett. 63, 2212.CrossRefGoogle Scholar
Borgström, S. et al. 1994 Proc. 4th International Coll. X-ray Lasers, Williamsburg, Virginia, 05 1994.Google Scholar
Bucksbaum, P.H. & Jones, R.R. 1992 In 1992 AIP Conf. Proc. 275, Walther, H. et al. eds. American Institute of Physics, New York.Google Scholar
Burnett, N.H. & Corkum, P.B. 1989 J. Opt. Soc. Am. B6, 1195.CrossRefGoogle Scholar
Crane, J.K. et al. 1992 Opt. Lett. 17, 1256.CrossRefGoogle Scholar
Dunne, M. et al. 1994 Phys. Rev. Lett. 72, 1024.CrossRefGoogle Scholar
Faris, G.W. & Hertz, H.M. 1989 Appl. Opt. 28, 4662.CrossRefGoogle Scholar
Fill, E. et al. 1995 Phys. Rev. E 51, 6016.Google Scholar
Glover, T.E. et al. 1994 Phys. Rev. Lett. 73, 78.CrossRefGoogle Scholar
Jones, R.R. & Bucksbaum, P.H. 1991 Phys. Rev. Lett. 67, 3215.CrossRefGoogle Scholar
Keldysh, L.V. 1964 Zh. Exp. Teor. Fiz. 47, 1945.Google Scholar
London, R.A. & Rosen, M.D. 1986 Phys. Fluids 29, 3813.CrossRefGoogle Scholar
Mohideen, U. et al. 1993 Phys. Rev. Lett. 71, 509.CrossRefGoogle Scholar
Offenberger, A.A. et al. 1993 Phys. Rev. Lett. 71, 3983.CrossRefGoogle Scholar
Penetrante, B.M. & Bardsley, J.N. 1991 Phys. Rev. A 43, 3100.CrossRefGoogle Scholar
Perry, M.D. et al. 1988 Phys. Rev. Lett. 60, 1270Google Scholar
Perry, M.D. et al. 1992 Opt. Lett. 17, 523.Google Scholar
Pont, M. & Gavrilla, M. 1990 Phys. Rev. Lett. 65, 2362.CrossRefGoogle Scholar
Svanberg, S. et al. 1993 Phys. Scripta 49, 187.CrossRefGoogle Scholar