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Theoretical study of a linear accelerator used as a VUV/X-ray source using the inverse Compton scattering mechanism:Comparisons and applications

Published online by Cambridge University Press:  09 March 2009

Robert A. Schill Jr  and
Edward McCrea
Robert A. Schill Jr
Affiliation:
Electrical and Computer Engineering, University of Nevada Las Vegas, 4505 Maryland Parkway, Las Vegas, Nevada 89154–4026
Edward McCrea
Affiliation:
EG&G Energy Measurements, Las Vegas Area Operations, P.O. Box 1912, Las Vegas, Nevada 89125
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Abstract

A classical linear theory is used to compare large synchrotron sources to a rf linear accelerator employed as a VUV/X-ray source. Comparisons are made on a per-pulse basis. It is demonstrated that the linear accelerator as an X-ray source is comparable to large synchrotron accelerators with wiggler insertion devices at the experiment. Applications to lithography, X-ray microscopy, X-ray spectroscopy and detector calibration are examined. Excluding lithography, the linear accelerator with an appropriate laser source is a useful source of X rays for these applications. As verification, classical results are compared with quantum mechanical results and are shown to be in good agreement.

Type
Regular Papers
Information
Laser and Particle Beams , Volume 15 , Issue 1 , March 1997 , pp. 179 - 196
Copyright
Copyright © Cambridge University Press 1997

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References

REFERENCES

Buckley, C.J. & Rarback, H. 1990 Modern Microscopies Techniques and Applications, Duke, P.J. and Michette, A.G., eds. (Plenum Press, New York), p. 74.Google Scholar
Carroll, F. et al. 1990 Invest. Radiol. 25, 465.CrossRefGoogle Scholar
Carroll, F. et al. 1991a Lasers Surg. Med. 11, 72.CrossRefGoogle Scholar
Carroll, F. 1991b In Proc. of the International Conf. on Lasers, p. 43.Google Scholar
Carroll, F. 1994 J. X-Ray Sci. Techn. 4, 1.Google Scholar
Carroll, F. et al. 1994 Invest. Radiol. 29, 266.CrossRefGoogle Scholar
EG&G ENERGY MEASUREMENTS INC. 1981 Los Alamos X-Ray Detector Calibration Sheet, Detectors Division, Las Vegas Area Operations, Serial No. XRD-49–015-LV.Google Scholar
Esarey, E. et al. 1993 Phys. Rev. E 48, 3003.CrossRefGoogle Scholar
Humphries, S. Jr 1986 Principles of Charged Particle Acceleration (John Wiley, New York), p. 493.Google Scholar
Jauch, J.M. & Rotrlich, F. 1995 Theory of Photons and Electrons (Addison Wesley, Reading, MA) p. 229.Google Scholar
Lai, B. et al. 1993 Argonne National Laboratory Report No. ANL/APS/TB-11.Google Scholar
Lawrence, Berkeley et al. LABORATORY REPORT 1989 Report No. PUB 643 Rev. 2.Google Scholar
Lawrence, Berkeley LABORATORY REPORT 1994 Report No. LBL 35912 UC-411.Google Scholar
Silverman, J. 1995 In IEEE Int. Conf. Plasma Sci. (Madison, WI).Google Scholar
Schill, R.A. Jr 1996 submitted for publ.Google Scholar
Shenoy, G.K. et al. Argonne National Lab. Report No. ANL-88–9.Google Scholar
Sprangle, P. et al. 1989 Appl. Phys. Lett. 55, 2559.CrossRefGoogle Scholar
Ting, A. et al. 1995 Naval Research Lab. Report No. NRL/MR/6790–95–7647.Google Scholar