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Simulation analysis of zinc ablation process and mass by intense pulsed ion beam irradiation

Published online by Cambridge University Press:  21 June 2017

J. Zhang ,
H.W. Zhong ,
X. Yu ,
J. Shen ,
G.Y. Liang ,
X.J. Cui ,
X.F. Zhang ,
G.L. Zhang ,
S. Yan  and
X.Y. Le
J. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
H.W. Zhong
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
X. Yu
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China School of Space and Environment, Beihang University, Beijing 100191, People's Republic of China
J. Shen
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
G.Y. Liang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
X.J. Cui
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
X.F. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
G.L. Zhang
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
S. Yan
Affiliation:
Institute of Heavy Ion Physics, Peking University, Beijing 100871, People's Republic of China
X.Y. Le*
Affiliation:
School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China Beijing Key Laboratory of Advanced Nuclear Energy Materials and Physics, Beihang University, Beijing 100191, People's Republic of China
*
Address correspondence and reprint requests to: X.Y. Le, School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China. E-mail: [email protected]
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Abstract

As the strong thermal effect in the surface, intense pulsed ion beam (IPIB) has been extensively used in material surface modification. The ablation is an important part in the interaction process between IPIB and material. In order to investigate the ablation mechanism, combined with IPIB dynamic energy spectrum and infrared imaging diagnostic results, a two-dimensional axisymmetric heat conduction model considering the effect of ablated material was constructed to describe the ablation process and calculate the lost mass of the targets. The influences of beam parameters and ablated matter on the ablation rate were discussed. The experimental and simulative results of ablation threshold and mass were compared.

Keywords

Intense pulsed ion beamsAblation processAblation rateAblation massDynamic energy spectrum
Type
Research Article
Information
Laser and Particle Beams , Volume 35 , Issue 3 , September 2017 , pp. 409 - 414
Copyright
Copyright © Cambridge University Press 2017 

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References

REFERENCES

Davis, H.A., Bartsch, R.R., Olson, J.C., Rej, D.J. & Waganaar, W.J. (1997). Intense ion beam optimization and characterization with infrared imaging. J. Appl. Phys. 82, 3223–3231.CrossRefGoogle Scholar
Isakova, Y.I. (2011). Infrared imaging diagnostics for parameters of powerful ion beams formed by a diode in a double-pulse mode. IEEE Pulsed Power Conf. pp. 334–340.CrossRefGoogle Scholar
Isakova, Y.I. & Pushkarev, A.I. (2013). Thermal imaging diagnostics of powerful ion beams. Instrum. Exp. Tech. 56, 185–192.CrossRefGoogle Scholar
Jiang, W., Hashimoto, N., Shinkai, H., Ohtomo, K. & Yatsui, K. (1998). Characteristics of ablation plasma produced by pulsed light ion beam interaction with targets and applications to materials science. Nucl. Instrum. Methods Phys. Res. Sect. A 415, 533–538.CrossRefGoogle Scholar
Li, L., Xiang, X., Lei, Y., Liao, W., Yuan, X., He, S., Jiang, X., Zheng, W. & Zu, X. (2013). A new method to investigate the intense pulsed ion beam ablation of silica. Nucl. Instrum. Methods Phys. Res. Sect. B 312, 131–136.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Y.I. (2013). A gigawatt power pulsed ion beam generator for industrial applications. Surf. Coatings Technol. 228, 382–384.CrossRefGoogle Scholar
Pushkarev, A.I., Isakova, Y.I. & Khailov, I.P. (2015). Intense ion beam generation in a diode with explosive emission cathode in self-magnetically insulated mode. Eur. Phys. J. D 69, 40.CrossRefGoogle Scholar
Rej, D.J., Davis, H.A., Olson, J.C., Remnev, G.E., Zakoutaev, A.N., Ryzhkov, V.A., Struts, V.K., Isakov, I.F., Shulov, V.A., Nochevnaya, N.A., Stinnett, R.W., Neau, E.L., Yatsui, K. & Jiang, W. (1997). Materials processing with intense pulsed ion beams. J. Vac. Sci. Technol. A 15, 1089–1097.CrossRefGoogle Scholar
Renk, T.J., Provencio, P.P., Prasad, S.V., Shlapakovski, A.S., Petrov, A.V., Yatsui, K., Jiang, W. & Suematsu, H. (2004). Materials modification using intense ion beams. Proc. IEEE 92, 1057–1080.CrossRefGoogle Scholar
Wu, D., Lei, M., Zhu, X. & Gong, Y. (2011). Numerical study on the ablation effects of tungsten irradiated by high-intensity pulsed ion beam. Phys. Proc. 22, 246–251.CrossRefGoogle Scholar
Yu, X., Shen, J., Ivanovna, Y., Zhong, H.W., Zhang, J., Yan, S., Zhang, G.L., Zhang, X.F. & Le, X.Y. (2015 a). Study of energy deposition of intense pulsed ion beam in metal target. Vacuum 122, 12–16.CrossRefGoogle Scholar
Yu, X., Shen, J., Qu, M., Liu, W., Zhong, H.W., Zhang, J., Zhang, Y.Y., Yan, S., Zhang, G.L., Zhang, X.F. & Le, X.Y. (2015 b). Characterization and analysis of infrared imaging diagnostics for intense pulsed ion and electron beams. Vacuum 113, 36–42.CrossRefGoogle Scholar
Ziegler, J.F., Ziegler, M.D. & Biersack, J.P. (2010). SRIM – the stopping and range of ions in matter. Nucl. Instrum. Methods Phys. Res. Sect. B 268, 1818–1823.CrossRefGoogle Scholar
Zhang, J., Yu, X., Zhong, H.W., Wei, B.B., Qu, M., Shen, J., Zhang, Y.Y., Yan, S., Zhang, G.L., Zhang, X.F. & Le, X.Y. (2015). The ablation mass of metals by intense pulsed ion beam irradiation. Nucl. Instrum. Methods Phys. Res. Sect. B 365, 210–213.CrossRefGoogle Scholar
Zhang, J., Zhong, H.W., Ye, Z.A., Shen, J., Liang, G.Y., Cui, X.J., Yu, X., Zhang, X.F., Zhang, G.L., Yan, S., Remnev, G.E. & Le, X.Y. (2017). Study on ablation products of zinc by intense pulsed ion beam irradiation. Laser Part. Beams 35, 1–6.Google Scholar
Zhao, W.J., Remnev, G.E., Yan, S., Opekounov, M.S., Le, X.Y., Matvienko, V.M., Han, B.X., Xue, J.M. & Wang, Y.G. (2000). Intense pulsed ion beam sources for industrial applications. Rev. Sci. Instrum. 71, 1045–1048.CrossRefGoogle Scholar