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Imaging spectroscopy of high-temperature plasma sources

Published online by Cambridge University Press:  09 March 2009

B. A. Bryunetkin ,
S. A. Pikuz ,
I. Y. Skobelev  and
A. Y. Faenov
B. A. Bryunetkin
Affiliation:
NPO VNIIFTRI, Mendeleevo 141570, Russian Federation
S. A. Pikuz
Affiliation:
NPO VNIIFTRI, Mendeleevo 141570, Russian Federation
I. Y. Skobelev
Affiliation:
NPO VNIIFTRI, Mendeleevo 141570, Russian Federation
A. Y. Faenov
Affiliation:
NPO VNIIFTRI, Mendeleevo 141570, Russian Federation
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Abstract

The imaging spectrograph with spherical crystal and transmission grating have been used to obtain the high spectrally and spatially resolved images of plasma X-ray microsources (fast z-pinch) as well as of laser-produced plasma flares up to 5 mm in extent. The spectral resolution λ/Δλ = 2·104 have been achieved using a quartz spherical mirror with the curvature radius 500 mm. Using a transmission grating spectrometer, the spectral density of power about 105 W/A in the “water window” has been measured in experiments with a fast z-pinch large pulse storage facility.

Type
Research Article
Information
Laser and Particle Beams , Volume 10 , Issue 4 , December 1992 , pp. 849 - 860
Copyright
Copyright © Cambridge University Press 1992

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References

REFERENCES

Aleksandrov, Y.M. et al. 1988 Laser Particle Beams 6, 521.CrossRefGoogle Scholar
Balashova, G.I. et al. 1991 in Proceedings of VNIIFTRI,Moscow, p. 112.Google Scholar
Bengamin, R.F. et al. 1977 Appl. Optics 61, 393.CrossRefGoogle Scholar
Boiko, V.A. et al. 1982 Pis'ma JTF 8, 1112 (in Russian).Google Scholar
Boiko, V.A. et al. 1985 J. Sov. Laser Res. 6, 85.Google Scholar
Ceglio, N.M. et al. 1983 Appl. Optics 22, 318.CrossRefGoogle Scholar
Chaker, M. 1989 Rev. Sci. Instrum. 60, 3386.CrossRefGoogle Scholar
Eidmann, K. et al. 1986 Laser Particle Beams 4, 521.CrossRefGoogle Scholar
Forster, E. et al. 1991 Laser Particle Beams 9, 135.CrossRefGoogle Scholar
Hawryluk, A.M. et al. 1981 in Low Energy X-Ray Diagnostics, Attwood, D.T. and Henke, B.L. eds. (AIP, New York), p. 286.Google Scholar
Henke, B.L. 1984 JOSA B1, 818.Google Scholar
Henke, B.L. 1985 Rev. Sci. Instrum. 56, 1537.CrossRefGoogle Scholar
Macgowan, B.J. et al. 1987 J. Appl. Phys. 61, 5243.CrossRefGoogle Scholar
Predehl, P. et al. 1978 Jpn. J. Appl. Phys. 17, 445.CrossRefGoogle Scholar
Shopper, H.W. et al. 1977 Appl. Optics 16, 1088.Google Scholar