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Easy spectrally tunable highly efficient X-ray backlighting schemes based on spherically bent crystals

Published online by Cambridge University Press:  01 July 2004

T. PIKUZ ,
A. FAENOV ,
I. SKOBELEV ,
A. MAGUNOV ,
L. LABATE ,
L.A. GIZZI ,
M. GALIMBERTI ,
A. ZIGLER ,
G. BALDACCHINI  and
F. FLORA
...Show all authors
T. PIKUZ
Affiliation:
Multicharged Ions Spectra Data Center of National Research Institute of Physical Technical and Radiotechnical Measurements, Mendeleyev, Moscow, Russia
A. FAENOV
Affiliation:
Multicharged Ions Spectra Data Center of National Research Institute of Physical Technical and Radiotechnical Measurements, Mendeleyev, Moscow, Russia
I. SKOBELEV
Affiliation:
Multicharged Ions Spectra Data Center of National Research Institute of Physical Technical and Radiotechnical Measurements, Mendeleyev, Moscow, Russia
A. MAGUNOV
Affiliation:
Multicharged Ions Spectra Data Center of National Research Institute of Physical Technical and Radiotechnical Measurements, Mendeleyev, Moscow, Russia
L. LABATE
Affiliation:
Intense Laser Irradiation Laboratory, Istituto per i Processi Chimico-Fsisici, Consiglio Nazionale delle Recherché, Area della Ricerca di Pisa, Pisa, Italy
L.A. GIZZI
Affiliation:
Intense Laser Irradiation Laboratory, Istituto per i Processi Chimico-Fsisici, Consiglio Nazionale delle Recherché, Area della Ricerca di Pisa, Pisa, Italy
M. GALIMBERTI
Affiliation:
Intense Laser Irradiation Laboratory, Istituto per i Processi Chimico-Fsisici, Consiglio Nazionale delle Recherché, Area della Ricerca di Pisa, Pisa, Italy
A. ZIGLER
Affiliation:
Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem, Israel
G. BALDACCHINI
Affiliation:
Ente per le nuove technologie l'energia e l'ambiente, Unita' Technico Scientifica Tecnologie Fisiche Avanzate, C.R. Frascati, Rome, Italy
F. FLORA
Affiliation:
Ente per le nuove technologie l'energia e l'ambiente, Unita' Technico Scientifica Tecnologie Fisiche Avanzate, C.R. Frascati, Rome, Italy
S. BOLLANTI
Affiliation:
Ente per le nuove technologie l'energia e l'ambiente, Unita' Technico Scientifica Tecnologie Fisiche Avanzate, C.R. Frascati, Rome, Italy
P. DI LAZZARO
Affiliation:
Ente per le nuove technologie l'energia e l'ambiente, Unita' Technico Scientifica Tecnologie Fisiche Avanzate, C.R. Frascati, Rome, Italy
D. MURRA
Affiliation:
Ente per le nuove technologie l'energia e l'ambiente, Unita' Technico Scientifica Tecnologie Fisiche Avanzate, C.R. Frascati, Rome, Italy
G. TOMASSETTI
Affiliation:
Istituto Nazionale per la Fisica della Materia, Dipartamento di Fisica dell'Aquila and Laboratory Nazionale del Gran Sasso, Istituto Nazionale di Fisica Nucleare, Assergi, Italy
A. RITUCCI
Affiliation:
Istituto Nazionale per la Fisica della Materia, Dipartamento di Fisica dell'Aquila and Laboratory Nazionale del Gran Sasso, Istituto Nazionale di Fisica Nucleare, Assergi, Italy
A. REALE
Affiliation:
Istituto Nazionale per la Fisica della Materia, Dipartamento di Fisica dell'Aquila and Laboratory Nazionale del Gran Sasso, Istituto Nazionale di Fisica Nucleare, Assergi, Italy
L. REALE
Affiliation:
Istituto Nazionale per la Fisica della Materia, Dipartamento di Fisica dell'Aquila and Laboratory Nazionale del Gran Sasso, Istituto Nazionale di Fisica Nucleare, Assergi, Italy
M. FRANCUCCI
Affiliation:
Istituto Nazionale per la Fisica della Materia, Universitó di Roma Tor Vergata, Roma, Italy
S. MARTELLUCI
Affiliation:
Istituto Nazionale per la Fisica della Materia, Universitó di Roma Tor Vergata, Roma, Italy
G. PETROCELLI
Affiliation:
Istituto Nazionale per la Fisica della Materia, Universitó di Roma Tor Vergata, Roma, Italy
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Abstract

New easy spectrally tunable backlighting schemes based on a spherically bent crystal are considered. Contrary to traditional backlighting scheme, in which the investigated objects should be placed between the backlighter and the crystal, for the considered schemes an object is placed downstream of the crystal, before the tangential or after the sagittal focus and an image of the object is recorded at the distance from the object corresponding to the needed magnification. The magnification is defined by the ratio of the distances from the sagittal focus to the detector and from the object to the sagittal focus. A ray-tracing modeling and experimental images of test meshes, obtained at incidence angles of the backlighter radiation of 10° and 22°, are presented. It is demonstrated that a simple linear transformation of the obtained astigmatic images allows reconstructing them as a stigmatic with an accuracy of 5–15%. For the spectral range around 9 Å a spatial resolution about 10 μm in a field of view of some square millimeters is achieved experimentally and confirmed by ray-tracing simulations.

Keywords

Plasma diagnosticsX-ray backlightingX-ray imagingX-ray optics
Type
Research Article
Information
Laser and Particle Beams , Volume 22 , Issue 3 , July 2004 , pp. 289 - 300
Copyright
© 2004 Cambridge University Press

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References

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