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Design, development, and testing of non-intercepting profile diagnostics for intense heavy ion beams using a capacitive pickup and beam induced gas fluorescence monitors

Published online by Cambridge University Press:  28 November 2006

F. BECKER ,
A. HUG ,
P. FORCK ,
M. KULISH ,
P. NI ,
S. UDREA  and
D. VARENTSOV
F. BECKER
Affiliation:
Technische Universität Darmstadt, Institut für Kernphysik, Darmstadt, Germany
A. HUG
Affiliation:
Technische Universität Darmstadt, Institut für Kernphysik, Darmstadt, Germany
P. FORCK
Affiliation:
GSI - Gesellschaft für Schwerionenforschung mbH, Darmstadt, Germany
M. KULISH
Affiliation:
IPCP, Departments of Chemistry and Material Sciences, Moscow, Russia
P. NI
Affiliation:
Technische Universität Darmstadt, Institut für Kernphysik, Darmstadt, Germany
S. UDREA
Affiliation:
Technische Universität Darmstadt, Institut für Kernphysik, Darmstadt, Germany
D. VARENTSOV
Affiliation:
GSI - Gesellschaft für Schwerionenforschung mbH, Darmstadt, Germany
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Abstract

An intense and focused heavy ion beam is a suitable tool to generate high energy density in matter. To compare results with simulations it is essential to know beam parameters as intensity, longitudinal, and transversal profile at the focal plane. Since the beam's energy deposition will melt and evaporate even tungsten, non-intercepting diagnostics are required. Therefore a capacitive pickup with high resolution in both time and space was designed, built and tested at the high temperature experimental area at GSI. Additionally a beam induced fluorescence monitor was investigated for the synchrotron's (SIS-18) energy-regime (60–750 AMeV) and successfully tested in a beam-transfer-line.

Keywords

Beam induced fluorescence (BIF) monitorBeam position monitor (BPM)CapacitiveGSIIntense beamsInertial fusionPickupQuadruple momentResidual gas
Type
Research Article
Information
Laser and Particle Beams , Volume 24 , Issue 4 , October 2006 , pp. 541 - 551
Copyright
© 2006 Cambridge University Press

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