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Absolute soft x-ray measurements with a transmission grating spectrometer

Published online by Cambridge University Press:  09 March 2009

K. Eidmann ,
T. Kishimoto ,
P. Herrmann ,
J. Mizui ,
R. Pakula ,
R. Sigel  and
S. Witkowski
K. Eidmann
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
T. Kishimoto
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
P. Herrmann
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
J. Mizui
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
R. Pakula
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
R. Sigel
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
S. Witkowski
Affiliation:
Max-Planck-Institut für Quantenoptik D-8046 Garching, Federal Republic of Germany
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Abstract

Absolute measurements of the soft x-ray emission (50 eV < hv < 1000 eV) from laser plasmas were made with transmission gratings, including pinhole-grating combinations for spatially resolved spectroscopy. Kodak 101–01 film was absolutely calibrated as a function of wavelength with the help of a bolometer, the laser plasma being used as a source. An example of a quantitatively analyzed, space-resolved pinhole grating spectrum recorded on film will be shown.

Type
Research Article
Information
Laser and Particle Beams , Volume 4 , Issue 3-4 , August 1986 , pp. 521 - 530
Copyright
Copyright © Cambridge University Press 1986

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