Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-09T05:41:33.615Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurements of the divergence of a 10-MA relativistic electron beam transported in a gas cell

Published online by Cambridge University Press:  09 March 2009

V. J. Harper-Slaboszewicz  and
W. E. Fowler
V. J. Harper-Slaboszewicz
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
W. E. Fowler
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
Get access Rights & Permissions [Opens in a new window]

Abstract

The increase in time-integrated divergence of a 1.7-MeV, 10-MA relativistic electron beam due to transport over 10 cm in a gas cell filled with 1 and 6 Torr of nitrogen was measured. The divergence was characterized by a multiple-pinhole beam sampling technique involving an aperture plate, an expansion region, and an attenuator plate followed by nylon radiochromic film. The divergence is determined by a fit of the measured deposition profile to response functions calculated using Monte Carlo coupled electronphoton transport codes. The initial value of 6.9° after the entrance foil is observed to increase to 12°. The errors in the measurement are quantified with Monte Carlo techniques. The response function fit gives a significantly better estimate of the divergence than a Gaussian fit.

Type
Research Article
Information
Laser and Particle Beams , Volume 9 , Issue 3 , September 1991 , pp. 749 - 758
Copyright
Copyright © Cambridge University Press 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Bloomquist, D. D. et al. 1987 In Digest of Technical Papers of the 6th IEEE Pulsed Power Conference, IEEE Catalog No. 87 CH2522–1,Bernstein, B. H. & Turchi, P. J., eds. (IEEE, Pennington, NJ).Google Scholar
Carlson, G. A. & Lorence, L. J. 1988 IEEE Trans. Nucl. Sci. 35, 1255.CrossRefGoogle Scholar
Fehl, D. L. 1990 Sandia National Laboratories Report No. SAND89–0956 (to be published).Google Scholar
Halbleib, J. A. & Mehlhorn, T. A. 1986 Nucl. Sci. Eng. 92, 338.CrossRefGoogle Scholar
Harper-Slaboszewicz, V. J. et al. 1990 In Conference Record of the 1990 IEEE International Conference on Plasma Science, IEEE Catalog No. 90 CH2857–1(IEEE,New York).Google Scholar
Hedemann, M. A. 1990 Private communication.Google Scholar
Humphreys, K. C. & Krantz, A. D. 1977 Radiat. Phys. Chem. 9, 737.Google Scholar
Kelly, J. G. & Schuch, R. L. 1976 Sandia National Laboratories Report No. SAND75–0668.Google Scholar
Kelly, J. G. & Vandevender, W. H. 1976 Sandia National Laboratories Report No. SAND75–0399.Google Scholar
McClenahan, C. R. et al. 1985 Sandia National Laboratories Report No. SAND85–0740C.Google Scholar
Parker, R. K., Anderson, R. E. & Duncan, C. V. 1974 J. Appl. Phys. 45, 2463.CrossRefGoogle Scholar
Toepfer, A. J. & Bradley, L. P. 1972 J. Appl. Phys. 43, 3033.CrossRefGoogle Scholar
Tripathi, V. K., Ottinger, P. F. & Guillory, J. 1983 J. Appl. Phys. 54, 3043.CrossRefGoogle Scholar