Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T11:41:33.245Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation of brightness of an intense pulsed ion beam by Thomson spectrometer

Published online by Cambridge University Press:  09 March 2009

K. Masugata ,
H. Okuda ,
K. Yatsui  and
T. Tazima
K. Masugata
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
H. Okuda
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
K. Yatsui
Affiliation:
Laboratory of Beam Technology, Nagaoka University of Technology, Nagaoka, Niigata 940–21, Japan
T. Tazima
Affiliation:
National Institute for Fusion Science, Nagoya 464, Japan
Get access Rights & Permissions [Opens in a new window]

Abstract

A method is proposed to evaluate the power brightness of an intense pulsed ion beam by using a Thomson parabola spectrometer (TPS). In the method, the time-dependent power brightness of each ion species can be determined independently from the density profile of ion tracks. The method is successfully utilized to evaluate the power brightness of ion beams produced in point pinch diode. The brightness of highly ionized carbons of 660 keV and oxygens of 880 keV, and singly ionized molecular ions of 400 keV, are evaluated independently. The total brightness is evaluated to be 3.2 GW/cm2/sr for highly ionized ions, and 1.9 GW/cm2/sr for molecular ions.

Type
Regular Papers
Information
Laser and Particle Beams , Volume 15 , Issue 2 , June 1997 , pp. 325 - 338
Copyright
Copyright © Cambridge University Press 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Chishiro, E. et al. 1996 Jpn. J. Appl. Phys. 35, L526.CrossRefGoogle Scholar
Duderstad, J.J. & Moses, G.A. 1982 Inertial Confinement Fusion (J. Wiley & Sons, Inc., New York).Google Scholar
Humphries, S. Jr 1980 Nucl. Fusion 20, 1549.CrossRefGoogle Scholar
Masugata, K. et al. 1992 Proc. Int'l. Conf. on High-Power Particle Beams, Washington, DC, p. 54.Google Scholar
Masugata, K. et al. 1996 J. Appl. Phys. 80 (9), 4813.CrossRefGoogle Scholar
Rhee, M.J. 1981 IEEE Trans. Nucl. Sci. NS-28, 2663.CrossRefGoogle Scholar
Sato, M. 1987 Jpn. J. Appl. Phys. 26, 927.CrossRefGoogle Scholar
Schneider, R.F. et al. 1985 J. Appl. Phys. 57, 1.CrossRefGoogle Scholar
Tanaka, H. et al. 1982 Jpn. J. Appl. Phys. 21, L647.CrossRefGoogle Scholar
Tazima, T. et al. 1986 Jpn. J. Appl. Phys. 25, L697.CrossRefGoogle Scholar