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Contribution from recoiling atoms in secondary electron emission induced by slow highly charged ions from tungsten surface

Published online by Cambridge University Press:  30 October 2012

Lixia Zeng ,
Zhongfeng Xu ,
Yongtao Zhao ,
Yuyu Wang ,
Jianguo Wang ,
Rui Cheng ,
Xiaoan Zhang ,
Jieru Ren ,
Xianming Zhou  and
Xing Wang
...Show all authors
Lixia Zeng
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China School of Physics and Electronic Engineering, Xianyang Normal University, Xianyang, China
Zhongfeng Xu*
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Yongtao Zhao*
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Yuyu Wang
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Jianguo Wang
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China
Rui Cheng
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Xiaoan Zhang
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China School of Physics and Electronic Engineering, Xianyang Normal University, Xianyang, China
Jieru Ren
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Xianming Zhou
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Xing Wang
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Yu Lei
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Yongfeng Li
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Yang Yu
Affiliation:
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Xueliang Liu
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China
Guoqing Xiao
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China
Fuli Li
Affiliation:
HCI Joint Center of Xi'an Jiaotong University and the National Laboratory for the Heavy Ion Research Facility in Lanzhou, Xi'an, China Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China
*
Address correspondence and reprint requests to: Zhongfeng Xu, Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China. E-mail: [email protected]; or Yongtao Zhao, Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China. E-mail: [email protected]
Address correspondence and reprint requests to: Zhongfeng Xu, Department of Applied Physics, Xi'an Jiaotong University, Xi'an, China. E-mail: [email protected]; or Yongtao Zhao, Institute of Modern Physics, Chinese Academy of Science, Lanzhou, China. E-mail: [email protected]
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Abstract

The electron emission yield γ induced by Ne2+ and O2+ impacting on a clean tungsten surface has been measured. The range of projectile energy is from 3 keV/u to 14 keV/u. The total electron yield gradually increases with the projectile velocity. It is found simultaneously that the total electron yield for O2+ is larger than the total electron yield for Ne2+, which is opposite to the results for higher projectile velocity. After considering the contribution from recoiling atoms to the energy distribution and electron emission yield, we find that recoiling atoms are of crucial importance in electron emission in our energy range. Thus, the unexpected results in our experiment can be explained successfully.

Keywords

Electron emission yieldEnergy distributionHighly charged ionsRecoiling atomsStopping power
Type
Research Article
Information
Laser and Particle Beams , Volume 30 , Issue 4 , December 2012 , pp. 707 - 711
Copyright
Copyright © Cambridge University Press 2012

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References

REFERENCES

Bajales, N., Cristina, L., Mendoza, S., Baragiola, R.A., Goldberg, E.C. & Ferrón, J. (2008). Exciton autoionization in ion induced electron emission. Phys. Rev. Lett. 100, 227604/1–4.CrossRefGoogle ScholarPubMed
Baragiola, R.A., Alonso, E.V. & Oliva-Florio, A. (1979). Electron emission from clean metal surfaces induced by low-energy light ions. Phys. Rev. B 19, 121–129.CrossRefGoogle Scholar
Ferron, J., Alonso, E.V., Baragiola, R.A. & Oliva-Florio, A. (1981). Electron emission from molybdenum under ion bombardment. J. Phys. D: Appl. Phys. 14, 1707–1720.CrossRefGoogle Scholar
Hoffmann, D.H.H., Blazevic, A., Ni, P., Rosmej, O., Roth, M., Tahir, N., Tauschwitz, A., Udrea, S., Varentsov, D., Weyrich, K. & Maron, Y. (2005). Present and future perspectives for high energy density physics with intense heavy ion and laser beams. Laser Part. Beams 23, 47–53.CrossRefGoogle Scholar
Hoffmann, D.H.H., Blazevic, A., Korostiy, S., Ni, P., Pikuz, S.A., Rosmej, O., Roth, M., Tahir, N.A., Udrea, S., Varentsov, D., Weyrich, K., Sharkov, B.Y. & Maron, Y. (2007). Inertial fusion energy issues of intense heavy ion and laser beams interacting with ionized matter studied at GSI-Darmstadt. Nucl. Instr. Meth. Phys. Res. Sec. A 577, 8–13.CrossRefGoogle Scholar
Holmén, G., Svensson, B., Schou, J. & Sigmund, P. (1979). Direct and recoil-induced electron emission from ion-bombarded solids. Phys. Rev. B 20, 2247–2254.CrossRefGoogle Scholar
Kudo, M., Sakai, Y. & Ichinokawa, T. (2000). Dependencies of secondary electron yields on work function for metals by electron and ion bombardment. Appl. Phys. Lett. 76, 3475–3477.CrossRefGoogle Scholar
Kumar, A. & Verma, A.L. (2011). Nonlinear absorption of intense short pulse laser over a metal surface embedded with nanoparticles. Laser Part. Beams 29, 333–338.CrossRefGoogle Scholar
Lindhard, J., Nielsen, V. & Scharff, M. (1968). Approximation Method in Classical Scattering by Screened Coulomb Fields. Copenhagen: Munksgaard.Google Scholar
Lucio, O.G., Gavin, J. & Dubois, R.D. (2006). Differential electron emission for single and multiple ionization of argon by 500 eV positrons. Phys. Rev. Lett. 97, 243201/1–4.Google ScholarPubMed
Michaelson, H.B. (1977). The work function of the elements and its periodicity. J. Appl. Phys 48, 4729–4733.CrossRefGoogle Scholar
Pikuz, S.A., Chefonov, O.V., Gasilov, S.V., Komarov, P.S., Ovchinnikov, A.V., Skobelev, I.Y., Ashitkov, S.Y., Agranat, M.V., Zigler, A. & Faenov, A.Y. (2010). Micro-radiography with laser plasma X-ray source operating in air atmosphere. Laser Part. Beams 28, 393–397.CrossRefGoogle Scholar
Rothard, H., Kroneberger, K., Clouvas, A., Veje, E. & Lorenzen, P. (1990). Secondary-electron yields from thin foils: A possible probe for the electronic stopping power of heavy ions. Phys. Rev. A 41, 2521–2535.CrossRefGoogle ScholarPubMed
Schou, J. (1980). Transport theory for kinetic emission of secondary electrons from solids. Phys. Rev. B 22, 2141–2174.CrossRefGoogle Scholar
Sternglass, E.J. (1957). Theory of secondary electron emission by high-speed Ions. Phys. Rev. 108, 1–12.CrossRefGoogle Scholar
Taulbjerg, K. & Sigmund, P. (1972). Deduction of Heavy-Ion X-Ray Production Cross Sections from Thick-Target Yields. Phys. Rev. A 5, 1285–1289.CrossRefGoogle Scholar
Wang, X., Zhao, Y.T., Cheng, R., Zhou, X.M., Xu, G., Sun, Y.B., Wang, Y.Y., Ren, J.R., Yu, Y., Li, Y.F., Zhang, X.A., Li, Y.Z., Liang, C.H. & Xiao, G.Q. (2012). Multiple ionization effects in M X-ray emission induced by heavy ions. Phys. Lett. A 376, 1197–1200.CrossRefGoogle Scholar
Wang, Y.Y., Zhao, Y.T., Qayyum, A. & Xiao, G.Q. (2007). Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions. Nucl. Instr. Meth. Phys. Res. Sec. B, 265, 474–478.CrossRefGoogle Scholar
Winterbon, K.B., Sigmund, P. & Sanders, J.B. (1970). Spatial distribution of energy deposited by atomic particles in elastic collisions. Kommissionær: Munksgaard.Google Scholar
Xu, Z.F., Zeng, L.X., Zhao, Y.T., Wang, J.G., Zhang, X.A., Xiao, G.Q. & Li, F.L. (2012). Charge Effect in Secondary Electron Emission from Silicon Surface Induced by Slow Neon Ions. Laser Part. Beams 30, 319–324.CrossRefGoogle Scholar
Zhang, X.A., Zhao, Y.T., Hoffmann, D.H.H., Yang, Z.H., Chen, X.M., Xu, Z.F., Li, F.L. & Xiao, G.Q. (2011). X-ray emission of Xe30+ ion beam impacting on Au target. Laser Part. Beams 29, 265–268.CrossRefGoogle Scholar
Zhao, Y.T., Xiao, G.Q., Xu, H.S., Zhao, H.W., Xia, J.W., Jin, G.M., Ma, X.W., Liu, Y., Yang, Z.H., Zhang, P.M., Wang, Y.Y., Li, D.H., Zhao, H.Y., Zhan, W.L., Xu, Z.F., Zhao, D., Li, F.L. & Chen, X.M. (2009). An outlook of heavy ion driven plasma research at IMP-Lanzhou. Nucl. Instr. Meth. Phys. Res. Sec. B 267, 163–166.CrossRefGoogle Scholar
Zhu, X.P., Zhang, F.G., Tang, Y. & Lei, M.K. (2011). Phase transformation under beam-target interactions during high-intensity pulsed ion beam irradiation at low pressure. Laser Part. Beams 29, 283–289.CrossRefGoogle Scholar
Ziegler, J.F., Ziegler, M.D. & Biersack, J.P. (2008). SRIM version SRIM2008. 04. http://www.srim.org.Google Scholar