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Marginal stability and critical thickness of strong double layers
Published online by Cambridge University Press: 13 March 2009
Abstract
Previous investigations of the stability, in particular the critical thickness for marginal stability, of an electron configuration of double-layer type are extended in order to include effects of (i) unequal plasma densities in the field-free regions, and (ii) finite values of the parameter eΔø/kTe. The results obtained are compared with the corresponding quantities in various experiments, and a striking coincidence is found.
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- Copyright © Cambridge University Press 1981
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