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Marginal stability and critical thickness of strong double layers

Published online by Cambridge University Press:  13 March 2009

Christer Wahlberg
Christer Wahlberg
Affiliation:
Department of Theoretical Electrotechnies, Institute of Technology, Uppsala University, Swoden
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Abstract

Previous investigations of the stability, in particular the critical thickness for marginal stability, of an electron configuration of double-layer type are extended in order to include effects of (i) unequal plasma densities in the field-free regions, and (ii) finite values of the parameter eΔø/kTe. The results obtained are compared with the corresponding quantities in various experiments, and a striking coincidence is found.

Type
Research Article
Information
Journal of Plasma Physics , Volume 26 , Issue 2 , October 1981 , pp. 317 - 331
Copyright
Copyright © Cambridge University Press 1981

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References

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