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The reliability prediction of torpedo electronic components in service life

Published online by Cambridge University Press:  14 July 2021

Qingwei Liang Open the ORCID record for Qingwei Liang [Opens in a new window] ,
Xin Zhang  and
Qixun Hu
Qingwei Liang*
Affiliation:
School of Marine Science and Technology, Northwestern Polytechnical University, Xi'an, Shanxi, 710072, P. R. China.
Xin Zhang
Affiliation:
School of Marine Science and Technology, Northwestern Polytechnical University, Xi'an, Shanxi, 710072, P. R. China.
Qixun Hu
Affiliation:
School of Marine Science and Technology, Northwestern Polytechnical University, Xi'an, Shanxi, 710072, P. R. China.
*
*Corresponding author. E-mail: [email protected]
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Abstract

For torpedo electronic components tested by functional verification, there are characteristics of a few samples and few failures. During service life, it is difficult to analyse and predict the changes in reliability. At present, management's observation of quality is mainly base on failure data, and it is difficult to make predictions about the moments without failure in service life. In this paper, according to the failure data, we consider such factors as performance degradation and detection and use the model of instantaneous failure rate to evaluate the reliability of the detection moments periodically, and predict the reliability of stages through the results of detection moments. The method proposed in this paper, on the one hand, considers the service experience, and on the other combines the detection data, to make the final evaluation result more credible. In addition, this paper predicts the changing trend of reliability between adjacent detection moments, which can provide a useful reference for quality management work.

Keywords

reliabilityfailure ratetorpedo general electronic componentsperformance degradationdetection
Type
Research Article
Information
The Journal of Navigation , Volume 74 , Issue 6 , November 2021 , pp. 1367 - 1380
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of The Royal Institute of Navigation

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