Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-23T04:00:06.205Z Has data issue: false hasContentIssue false

An Innovative Phase Shifting System for Non-Destructive Testing

Published online by Cambridge University Press:  05 May 2011

C. W. Chen*
Affiliation:
Department of Civil Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
H. Y. Chang*
Affiliation:
Department of Civil Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.
C. K. Lee*
Affiliation:
Institute of Applied Mechanics, National Taiwan University, Taiwan, Taipei, R.O.C.
*
*Graduate student
*Graduate student
**Professor
Get access

Abstract

Phase shifting technique is one of the most important technologies in the metrology field. Simply by performing an interferogram measurement, and then adopting the phase shifting technique to unwrap the interferogram into a phase map, tasks such as object surface profile reconstruction, holographic interferometry, electronic speckle pattern interferometry, etc., can all be easily accomplished. An innovative phase shifting system, which uses piezoelectric actuators to execute phase shifting first and then implementing a cellular automata algorithm to unwrap phase data, was designed, built, and tested. Since cellular automata is a true parallel process, and noise appearing within the interferogram will not get propagated, this novel system is far more robust than the systems based on the traditional path following phase-unwrapping algorithm. In addition, this new algorithm also provides us with a way to adopt phase-masks within the cellular automata implementations of the phase unwrap operations. All these newly developed techniques make this newly developed system adaptable to many metrology applications, even when high noise is present or when lateral shear exists within the image field. The successful incorporation of the phase-mask approach into the cellular automata phase unwrapping algorithm essentially makes this newly developed system adaptable to take phase map measurements in many practical applications.

Type
Articles
Copyright
Copyright © The Society of Theoretical and Applied Mechanics, R.O.C. 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Creath, , Katherine, , “Phase Shifting Speckle Interferometry”, Appl. Opt., 24, 3053 (1985).Google Scholar
2.Robinson, D. W. and Reid, G. T., Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, IOP Publishing Ltd., (1993).Google Scholar
3.WaveAlyzer Manual, Melles-Griot, Colorado, U.S.A. (1994).Google Scholar
4.Tribolet, , Jose, M., “A New Phase Unwrapping Algorithm” IEEE Trans. Image Process., ASSP-25, 2,April(1997).Google Scholar
5.Ghiglia, D., Mastin, G. and Romero, L.“Cellular-Automata Method for Phase Unwrapping” J. Opt. Soc. Am., 4, pp. 267280 (1987).CrossRefGoogle Scholar
6.Spik, A. and Robinson, D. W., “Investigation of the Cellular Automata Method for Phase Unwrapping and Its Implementation on an Array Processor,” Optics and Lasers in Engineering, 14 25 (1991).Google Scholar
7. ZMOD PHASE SHIFTING SYSTEM Manual, Phase Shifting Technology, Inc. (1989).Google Scholar
8.Wolfram, , Stephen, , “Cellular Automata”, Los Alamos Science No. 9, Los Alamos Nat. Lab., Los Alamos, N. M, U.S.A., (1983).Google Scholar
9.Frank, L., Pedrotti, S. J. and Pedrotti, Leno, S., Introduction to Optics, 2nd ed., Prentice-Hall International, Inc.Google Scholar
10.Breuckmann, Bemd, and Thieme, , Werner, , “Computer-Aided Analysis of Holographic Interferograms Using the Phase-Shift Method,” Appl. Opt., 24, pp. 21452149 (1985).Google Scholar
11.Tektronix AM501 Manual, Beaver, Washington, U.S.A.Google Scholar
12.Hariharan, P., Orbel, B. F. and Eiju, T., Digital Phase-Shifting Interferometry: a Simple Error-Compensating Phase Calculation,” Appl. Opt., Vol. 26, 2504(1987).Google Scholar
13.Lab VIEW for Windows User Manual, National Instruments Corporate Headquarters, Austin, U.S.A. December (1993).Google Scholar
14.Marroquin, , Jose, L. and Mariano, , “Quadratic Regularization Functional for Phase Unwrapping,” J. Opt. Soc. Am., Vol. 12, 2393 (1995).Google Scholar
15.AT-MIO 16 E Series User Manual, National Instrument, March 1995 Edition.Google Scholar
16.Snap Shot for Lab VIEW for Windows, Viewpoint Software Solutions, Inc. (1994).Google Scholar
17.Drain, L. E., The Laser Doppler Technique, John Wiley and Sons, New York (1980).Google Scholar
18. “Multilayer Piezoelectric Actuator” Insp. Rec. No. 912-46S-02039, by Tokin America Inc., displacement: 14.4μm at 100VDC for 17.891mm length.Google Scholar
19.Surface ViewTM for LabVIEW 3, Version 3.0.2 User Manual, Metric System, 1506 Drive, Round Rock, TX 78681, U. S. A.Google Scholar
20.DuPont Photopolymer OmniDex 706, E. I. Du Pont De Nemours & Co., Inc., Experimental Station, Wilmington, DE 19880–9631 (1995).Google Scholar