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Discussion on microstructure of chemical-vapor-deposited TiN films based on the calculated gaseous concentration distribution in the reactor
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- 03 March 2011, pp. 2801-2807
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Impedance spectroscopy of grain boundaries in nanophase ZnO
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- 03 March 2011, pp. 2295-2300
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Sputtered WSix for micromechanical structures
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- 03 March 2011, pp. 1710-1720
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Diamond nucleation and growth on reactive transition-metal substrates
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- 03 March 2011, pp. 1455-1460
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Influence of surface roughness on the wetting angle
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- 03 March 2011, pp. 1984-1992
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Partial melting and segregation behavior in a superplastic Si3N4/Al–Mg alloy composite
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- 03 March 2011, pp. 133-138
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Analysis of pore structure of activated carbon fibers using high resolution transmission electron microscopy and image processing
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- 03 March 2011, pp. 2507-2517
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Modification of the surface properties of carbon fibers via the catalytic growth of carbon nanofibers
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- 03 March 2011, pp. 625-633
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Dielectric and electrostrictive properties of (1 – x) Pb(Mg1/3Nb2/3)O3−xPb(Mn2/3W1/3)O3 ceramics
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- 03 March 2011, pp. 939-944
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Accelerated microwave synthesis of magnesium sulfide with the pro-heating medium of graphite
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- 03 March 2011, pp. 334-338
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Evidence for glide and rotation defects observed in well-ordered graphite fibers
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- 03 March 2011, pp. 1461-1468
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Rheology of aqueous boehmite-coated silicon nitride suspensions and gels
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- 03 March 2011, pp. 2808-2816
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Growth of highly oriented La0.84Sr0.16MnO3 perovskite films
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- 03 March 2011, pp. 2518-2522
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Mechanical properties and microtructure of sputter-deposited Nb5Si3/Nb microlaminates
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- 03 March 2011, pp. 1721-1729
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Loss spectra of pure and La-doped MgTiO3 microwave ceramics
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- 03 March 2011, pp. 2301-2305
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A simplified analytical model of diamond growth in direct current arcjet reactors
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- 03 March 2011, pp. 1993-2010
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The structure and property characteristics of amorphous/nanocrystalline silicon produced by ball milling
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- 03 March 2011, pp. 139-148
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Transmission electron microscopy study of Al/Al2O3 composites fabricated by reactive metal infiltration
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- 03 March 2011, pp. 1216-1225
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Analysis of nitride films on silicon substrates by ion beam methods
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- 03 March 2011, pp. 3124-3128
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Change of the critical thickness in the preferred orientation of TiN films
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- 03 March 2011, pp. 634-639
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