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X-ray and electron diffraction study of single crystal Bi2Sr2CaCu2Ox

Published online by Cambridge University Press:  31 January 2011

X. B. Kan ,
J. Kulik ,
P. C. Chow ,
S. C. Moss ,
Y. F. Yan ,
J. H. Wang  and
Z. X. Zhao
X. B. Kan
Affiliation:
Physics Department and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5504
J. Kulik
Affiliation:
Physics Department and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5504
P. C. Chow
Affiliation:
Physics Department and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5504
S. C. Moss
Affiliation:
Physics Department and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5504
Y. F. Yan
Affiliation:
Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, People's Republic of China
J. H. Wang
Affiliation:
Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, People's Republic of China
Z. X. Zhao
Affiliation:
Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, People's Republic of China
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Abstract

Using both x-ray and electron diffraction, we have studied the incommensurate modulation structure in single crystal Bi2Sr2CaCu2Ox. Electron diffraction clearly indicates a small a∗-axis component of the modulation wave vector k, along with the more familiar b∗-axis component (0.004a∗ + 0.212b∗). This tilt of the k-vector breaks the mirror symmetry perpendicular to a- and b-axes as well as the twofold symmetry about a- and b-axes. The modulated structure thereby has only a mirror plane normal to the c-axis. Intense x-ray streaking along the c-axis at several satcllite reflections was considerably more pronounced than at the fundamental reflections, indicating a stacking disorder along the c-axis predominantly in the modulated structure.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 4 , April 1990 , pp. 731 - 736
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, T., Jpn. J. Appl. Phys. 27, L209 (1988).CrossRefGoogle Scholar
2Tarascon, J. M., McKinnon, W. R., Barboux, P., Hwang, D. M., Bagley, B. G., Greene, L. H., Hull, G.W., LePage, Y., Stoffel, N., and Giroud, M., Phys. Rev. B 38, 8885 (1988).Google Scholar
3Liang, J.K., Xie, S.S., Che, G.C., Huang, J.Q., Zhang, Y.L., and Zhao, Z. X., Modern Phys. Lett. B 2, No. 1, 483 (1988).Google Scholar
4Sunshine, S. A., Siegrist, T., Schneemeyer, L. F., Murphy, D.W., Cava, R. J., Batlogg, B., van Dover, R. B., Fleming, R. M., Glarum, S. H., Nakahara, S., Farrow, R., Krajewski, J. J., Zahurak, S. M., Waszczak, J.V., Marshall, J. H., Marsh, P., Rupp, L.W., and Peck, W. F., Phys. Rev. B 38, 893 (1988).CrossRefGoogle Scholar
5Zandbergen, H.W., Groen, W. A., Mijlhoff, F. C., van Tendeloo, G., and Amelinckx, S., Physica C 156, 325 (1988).Google Scholar
6Hewat, E.A., Capponi, J. J., and Marezio, M., Physica C 157, 502 (1989).Google Scholar
7Tarascon, J. M., LePage, Y., Barboux, P., Bagley, B. G., Greene, L. H., McKinnon, W. R., Hull, G.W., Giroud, M., and Hwang, D. M., Phys. Rev. B 37, 9382 (1988).Google Scholar
8Withers, R. L., Thompson, J. G., Wallenberg, L. R., FitzGerald, J. D., Anderson, J. S., and Hyde, B. G., J. Phys. C: Sol. Sta. Phys. 21, 6067 (1988).CrossRefGoogle Scholar
9Subramanian, M. A., Torardi, C. C., Calabrese, J. C., Gopalakrishnan, J., Morrissey, K. J., Askew, T. R., Flippen, R. B., Chowdhry, U., and Sleight, A.W., Sci. 239, 1015 (1988).Google Scholar
10LePage, Y., McKinnon, W.R., Tarascon, J.M., and Barboux, P., Phys. Rev. B 40, 6810 (1989).Google Scholar
11Torardi, C.C., Parise, J. B., Subramanian, M.A., Gopalakrishnan, J., and Sleight, A.W., Physica C 157, 115 (1989).Google Scholar
12Hirotsu, Y., Tomioka, O., Ohkubo, T., Yamamoto, N., Nakamura, Y., Nagakura, S., Komatsu, T., and Matsushita, K., Jpn. J. Appl. Phys. 27, No. 10, L1869 (1988).CrossRefGoogle Scholar
13Matsui, Y., Maeda, H., Tanaka, Y., Horiuchi, S., Takekawa, S., Takayama-Muromachi, E., Umezono, A., and Ibe, K., JEOL News, 26E, No. 2, 36 (1988).Google Scholar
14Shindo, D., Hiraga, K., Mirabayashi, M., Kikuchi, M., and Syono, Y., Jpn. J. Appl. Phys. 27, L1018 (1988).CrossRefGoogle Scholar
15Olivier, S., Groen, W. A., van der Beek, C., and Zandbergen, H.W., Physica C 157, 531 (1989).CrossRefGoogle Scholar
16Sequeira, A., Rajagopal, H., and Yakhmi, J.V., Physica C 157, 515 (1989).CrossRefGoogle Scholar
17Albouy, P. A., Moret, R., Potel, M., Gougeon, P., Padiou, J., Levet, J. C., and Noël, H., J. Phys. France 49, 1987 (1988).Google Scholar
18Yan, Y. F., Li, C. Z., Chu, X., Wang, J. H., Fung, K. K., Chang, Y. C., Chen, G. H., Zheng, D. N., Mai, Z. H., Yang, Q. S., and Zhao, Z. X., Modern Phys. Lett. B 2, No. 2, 571 (1988).Google Scholar
19Gao, Y., Lee, P., Coppens, D., Subramanian, M.A., and Sleight, A.W., Sci. 241, 954 (1988).Google Scholar