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Variation of orientation and morphology of epitaxial SrBi2Ta2O9 and SrBi2Nb2O9 thin films via the coating-pyrolysis process

Published online by Cambridge University Press:  31 January 2011

T. Nagahama ,
T. Manabe ,
I. Yamaguchi ,
T. Kumagai ,
S. Mizuta  and
T. Tsuchiya
T. Nagahama
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1–1, Tsukuba, Ibaraki 305–8565, Japan
T. Manabe
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1–1, Tsukuba, Ibaraki 305–8565, Japan
I. Yamaguchi
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1–1, Tsukuba, Ibaraki 305–8565, Japan
T. Kumagai
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1–1, Tsukuba, Ibaraki 305–8565, Japan
S. Mizuta
Affiliation:
National Institute of Materials and Chemical Research, Higashi 1–1, Tsukuba, Ibaraki 305–8565, Japan
T. Tsuchiya
Affiliation:
Department of Materials Science and Technology, Science University of Tokyo, Yamazaki 2641, Noda, Chiba 278–0022, Japan
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Abstract

Orientation-controlled epitaxial thin films of bismuth layer-structured ferroelectrics, SrBi2Ta2O9 (SBT) and SrBi2Nb2O9 (SBN), were prepared on single-crystal SrTiO3 (STO) substrates by the coating-pyrolysis process. Most of the SBT (SBN) films showed the (106) and (001) orientations on STO(110) and (001), respectively. The degree of orientation, in terms of the ratio of peak intensity to the background level in the x-ray diffraction φ-scan profile for the film, greatly increased with a decrease in the oxygen partial pressure, p(O2), of annealing atmosphere at 800 °C. Interestingly, coexistence of the (110)-oriented grains with the (106)-oriented ones on STO(110) [and the (100)-oriented grains with the (001)-oriented ones on STO(001)] was observed exclusively in the SBT films annealed at 700–750 °C under p(O2) of 10 Pa. Atomic force microscopy observations showed that the surface morphology of the SBT films remained almost unchanged, i.e., comprising round-shaped grains of submicrometer size, whereas that of the SBN films drastically changed, according to the variation in orientation of substrate surfaces or in annealing conditions, i.e., temperature, p(O2), and time.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 3 , March 2000 , pp. 783 - 792
Copyright
Copyright © Materials Research Society 2000

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