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Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation

Published online by Cambridge University Press:  31 January 2011

D. Bhattacharyya ,
N.A. Mara ,
P. Dickerson ,
R.G. Hoagland  and
A. Misra
D. Bhattacharyya
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
N.A. Mara
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
P. Dickerson
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
R.G. Hoagland
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
A. Misra
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

Nanoscale metallic multilayers, comprising two sets of materials—Cu/Nb and Cu/Ni—were deposited in two different layer thicknesses—nominally 20 and 5 nm. These multilayer samples were indented, and the microstructural changes under the indent tips were studied by extracting samples from underneath the indents using the focused ion beam (FIB) technique and by examining them under a transmission electron microscope (TEM). The deformation behavior underneath the indents, manifested in the bending of layers, reduction in layer thickness, shear band formation, dislocation crossing of interfaces, and orientation change of grains, has been characterized and interpreted in terms of the known deformation mechanisms of nanoscale multilayers.

Keywords

NanoindentationNanoscaleTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 3 , March 2009 , pp. 1291 - 1302
Copyright
Copyright © Materials Research Society 2009

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References

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