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Transmission electron microscopy studies of bismuth films

Published online by Cambridge University Press:  31 January 2011

S. Nahm ,
L. Salamanca-Riba ,
D. L. Partin  and
J. Heremans
S. Nahm
Affiliation:
University of Maryland, College Park, Maryland 20742-2115
L. Salamanca-Riba
Affiliation:
University of Maryland, College Park, Maryland 20742-2115
D. L. Partin
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090-9055
J. Heremans
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090-9055
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Abstract

We have studied the structure of Bi films grown on BaF2 substrates as a function of the distance from the interface with the substrate. Close to the interface the films show a polycrystalline structure and probably contain some amorphous regions. The crystallite size increases as the distance from the interface increases. At distances ≥90 nm the film becomes single crystalline and has the (111) trigonal direction normal to the film surface. Our structural data relate very well to mobility measurements performed on samples grown under the same conditions. Our results suggest that the carrier mobility is higher at distances ≥90 nm from the interface, where the film is single crystalline, than close to the interface, where it is polycrystalline.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 4 , April 1990 , pp. 784 - 788
Copyright
Copyright © Materials Research Society 1990

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References

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