Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-23T15:58:25.437Z Has data issue: false hasContentIssue false
  • English
  • Français

Transmission electron microscopy of C70 single crystals at room temperature

Published online by Cambridge University Press:  31 January 2011

Vinayak P. Dravid ,
Xiwei Lin ,
Hong Zhang ,
Shengzhong Liu  and
Manfred M. Kappes
Vinayak P. Dravid
Affiliation:
Department of Materials Science and Engineering, R. R. McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
Xiwei Lin
Affiliation:
Department of Materials Science and Engineering, R. R. McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
Hong Zhang
Affiliation:
Department of Materials Science and Engineering, R. R. McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
Shengzhong Liu
Affiliation:
Department of Chemistry, Northwestern University, Evanston, Illinois 60208
Manfred M. Kappes
Affiliation:
Department of Chemistry, Northwestern University, Evanston, Illinois 60208
Get access

Abstract

Transmission electron microscopy (TEM) techniques have been employed to study the room temperature solid state form of chromatographically purified C70. Tilting and electron diffraction experiments in three-dimensional reciprocal space, on samples prepared by crystallization from several different solvents, show that C70 crystallites adopt hexagonal close packed (hcp) structure with a = 1.01 ± 0.05 nm and c = 1.70 ± 0.08 nm. The extinctions and observed reflections conform to the P63/mmc space group. High resolution TEM images reveal the molecular order and periodicity associated with C70 crystallites in real space. The experimental results are in agreement with the preliminary computations of crystal structure within acceptable error limits.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 9 , September 1992 , pp. 2440 - 2446
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Krätschmer, W., Fostiropoulous, K., and Huffmann, D., Chem. Phys. Lett. 170, 167 (1990)CrossRefGoogle Scholar
2.Bethune, D., Meijer, G., Tang, W., and Rosen, H.J., Chem. Phys. Lett. 174, 219 (1990).CrossRefGoogle Scholar
3.Haufler, R., Conceicao, J., Chibante, L., Chai, Y., Byrne, N., Flanagan, S., Haley, M., O'Brien, S., Pan, C., Xiao, Z., Billups, W., Ciufolini, M., Hauge, R., Margrave, J., Wilson, L., Curl, R., and Smalley, R., J. Phys. Chem. 94, 8634 (1990).CrossRefGoogle Scholar
4.Aije, H., Alvarez, M., Anz, S., Beck, R., Diederich, F., Fostiropoulos, K., Huffmann, D., Krätschmer, W., Rubin, Y., Shriver, K., Sensharma, K., and Whetten, R., J. Phys. Chem. 94, 8630 (1990).CrossRefGoogle Scholar
5.Heiney, P., Fischer, J., McGhie, A., Romanow, W., Denenstein, A., McCauley, J., Jr., and Smith, A. III, Phys. Rev. Lett. 66, 2911 (1991).CrossRefGoogle Scholar
6.David, W., Ibberson, R., Matthewman, J., Prassides, K., Dennis, T., Hare, J., Kroto, H., Taylor, R., and Walton, D., Nature 353, 147 (1991); S. Liu, Y. Lu, M. Kappes, and J. Ibers, Science 254, 408 (1991).CrossRefGoogle Scholar
7.Hedberg, K., Hedberg, L., Bethune, D., Brown, C., Dorn, H., Johnson, R., and de Vries, M., Science 254, 410 (1991).CrossRefGoogle Scholar
8.Baker, J., Fowler, P., Lazzeretti, P., Malagoli, M., and Zanasi, R., Chem. Phys. Lett. 184, 182 (1991); G. Scuseria, Chem. Phys. Lett. 180, 451 (1991).CrossRefGoogle Scholar
9.Balch, A., Catalano, V., Lee, J., Olmstead, M., and Parki, R., J. Am. Chem. Soc. 113, 8953 (1991).CrossRefGoogle Scholar
10.Johnson, R., Meijer, G., Salem, J., and Bethune, D., J. Am. Chem. Soc. 113, 3619 (1991).CrossRefGoogle Scholar
11.Dravid, V., Liu, S., and Kappes, M., Chem. Phys. Lett. 185, 75 (1991).CrossRefGoogle Scholar
12.Vaughan, G., Heiney, P., Fischer, J., Luzzi, D., Ricketts-Foot, D., McGhie, A., Hui, Y., Smith, A., Cox, D., Romanow, W., Allen, B., Coustel, N., McCauley, J., Jr., and Smith, A. III, Science 254, 1350 (1991).CrossRefGoogle Scholar
13.Meilunas, R., Chang, R., Liu, S., Jensen, M., and Kappes, M., J. Appl. Phys. 70, 5128 (1991).CrossRefGoogle Scholar
14.Dravid, V., Liu, S., Zhang, H., Marks, L., and Kappes, M., to be published.Google Scholar
15. See, for example, Wang, S. and Buseck, P., Chem. Phys. Lett. 182, 1 (1991); Y. Saito, N. Suzuki, H. Shinohara, and Y. Ando, Jpn. J. Appl. Phys. (1991, in press).CrossRefGoogle Scholar
16.Fink, J., Müller-Heinzerling, T., Pflüger, J., Bubenzer, A., Koidl, P., Crecelius, G., Solid State Commun. 47, 678 (1983); J. Osai, T. Oikawa, M. Inoue, Y. Matsui, and T. Endo, J. Electron Spectrosc.27, 243 (1991).CrossRefGoogle Scholar
17. See also P. Hansen, Fallon, P., and Krätschmer, W., Chem. Phys. Lett. 181, 367 (1991).Google Scholar
18.Guo, Y., Karasawa, N., and Goddard, W., Nature 351,464 (1991).Google Scholar